Data Acquisition and Control Seminar
27 July, 2017
8:30 AM – 12:30 PM
National Instruments NZ
Training Room
23/23 Edwin St, Mt Eden
Auckland, New Zealand
With a need for more data points, increasing connectivity, smarter edge analytics, server side analysis in measurement, monitoring and control applications, developers require more advanced solution to solve today’s challenges.
Through technical presentations, live demonstrations and industry case studies, attendees will explore how they can take advantage of a platform based approach to solve the challenges they face in industry, such as monitoring their large, critical assets, building tightly synchronized high-channel count Test Cells, and autonomous control. We will also discuss trending and enabling technologies, such as the convergence of OT and IT technologies.
At the end of this event, you will learn:
- About the advantages of a based approach to engineering measurement and control challenges
- Best practices for building accurate,flexible and future proof measurement and control systems
- About trending technologies including Time Sensitive Networking (TSN), Augmented Reality, Smart Edge Analytics, and OT and IT convergence
This seminar is designed for engineers, scientists and technicians who are looking for cost effective, future proof solutions for their measurement, control and monitoring applications and creating or retrofitting systems with IoT technologies. It will also benefit, those who don’t necessarily have a software background.