Test & Measurement Seminar - Hyderabad
27 July, 2017
9:00 AM – 4:00 PM
Radisson Hyderabad Hitec City
Gachibowli, Miyapur Road
Hyderabad, India
Customized Measurements, changing requirements, better test coverage and higher test throughputs! – These are constant pressures faced by any engineer working on test, validation and measurement. Test and Measurement applications vary from simple sensor measurement to complex validation test, automated production tests and inspection systems. Organizations are continuously evolving and making their systems better and smarter. To test their smart systems, manufacturers are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter modular, software defined test systems that scale with escalating requirements to shorten time to market and drive down cost.
Attend the NI Test and Measurement Seminar, to learn the technologies and solution architectures for building your test, measurement and inspection systems.
Event Highlights:
• Learn how to acquire data from sensors and build a synchronized high channel data acquisition system
• How to build an Automated Test and Measurement system?
• Experience these tools with live demonstrations and application discussions.
• Explore solutions for Semiconductor chip test and Wireless devices test ranging from testing RFICs and Power Management ICs, Mixed Signal Tests and Digital Protocol tests.
• Learn some of the best practices involved in designing a modular and scalable Automated Test.
• Explore solutions for Automated tests for Infotainment Systems as well as ADAS (Advance Driver Assistance Systems) Systems
• Have a look at some of the applications that your industry peers have developed.
Who should attend?
• Design Engineers working on Characterization Tests.
• Validation Engineers working on Functional Validation Tests.
• Test Engineers building test setups for physical component testing.
• Test Engineers or System Integrators building Automated Production Test Setups.
Agenda:
Time |
Session Name |
09:30 AM – 11:00 AM |
Overview of NI platform for Test and Measurement Applications |
11:00 AM – 11:15 AM |
Tea Break |
11:15 AM – 12:30 PM |
Solutions for Semiconductor Chip Tests and Wireless Devices Tests |
12:30 PM – 01:30 PM |
Lunch Break |
01:30 PM – 02:15 PM |
Best Practices for Architecting an Automated Test System |
02:15 PM - 03:00 PM |
Solution Architectures for Automated Tests |
03:00 PM – 03:30 PM |
Application Sessions from successful NI Customers |
03:30 PM – 04:00 PM |
Tea Break and Discussions |