NI Days are back! Innovazione, competenza e tecnologia all'avanguardia!
Siamo entusiasti di annunciare il ritorno di NI Days, un evento gratuito di una giornata, ricco di sessioni informative, aggiornamenti di prodotto e sessioni tecniche pratiche. L’evento si terrà a Milano il 18 febbraio 2025, dove verranno mostrate le ultime tecnologie NI, con la possibilità di toccarle con mano, supportati da esperti di settore e dai colleghi NI.
Le complessità delle sfide ingegneristiche sono in continua crescita e i sistemi di test devono adattarsi di conseguenza, diventando sempre più veloci, intelligenti e affidabili. Ad NI Days scoprirai come le nostre soluzioni potranno supportarti in questa sfida!
Demo live della tecnologia NI, tra cui DAQ, PXI e altro.
Sessioni tecniche guidate da esperti su argomenti come l’automazione del test e l'acquisizione dei dati.
Possibilità di toccare con mano le novità nell’ambito dei sistemi di test, con un occhio alla scalabilità e all’efficienza.
Area espositiva dedicata alle soluzioni dei partner tecnologici e degli Alliance Partner di NI.
Networking con colleghi del settore ed esperti di NI.
Agenda
The content will be presented in the local language, except for those sessions marked with an asterisk.
08:00
Registration opens & EXPO
09:30 – 10:30
Keynote: A Software Defined Approach to Test
Join leaders from NI and Industry and they discuss why software is foundational to the way we approach test today, and how it will shape the future of test for years to come.
Andrea Riva, Allan Solomon, Rudy Sengupta, Massimiliano Banfi, Kevin Schultz - NI
External Speaker: Antonio Di Guardo, MMI Medical Microinstruments
10:30 – 11:00
Coffee break
11:00 – 11:30
New Product Showcase*
Demonstrations of the latest product and feature releases, highlighting the LabVIEW+ Suite as well as PXI and DAQ hardware platforms.
Anna Pedale, Fabio Mussi, Andrea Nobile - NI
11:30 – 12:15
Software and Technology Investment*
Dive into the 3-year roadmap of our software portfolio looking at design decisions and priorities for critical areas such as CI/CD integration, ecosystem interoperability, accelerated development environments, security and more. This session will also discuss the practical implementation of AI into NI Development tools in 2025 and beyond.
Overcoming 3 Manufacturing Test Challenges with TestStand
During this session, we will discuss the challenges of changing requirements, throughput, and software development and maintenance.
LabVIEW vs Python: Why not Both
In this session, we'll discuss why LabVIEW and Python are better together for test, and how leveraging the strengths of each tools will help you and your team create better automated test systems.
Tips and Tricks for the Best LabVIEW User Interface
It’s easier than you think but it’s something most users find challenging. Come learn how to create modern user interfaces in LabVIEW that are resizable, dynamic, and responsive.
Introduction to DQMH
DQMH is the world’s most popular 3rd-party framework for LabVIEW, and was designed to facilitate the robust implementation of complex LabVIEW applications, while still being accessible to CLAD/CLD-level LabVIEW programmers.
Hardware Fundamentals Sessions
What's New in RF Hardware and Software?
NI has been working to enhance its RF products since the release of the first vector signal transceiver in 2012. In this session, discover the advancements NI is making to its RF portfolio.
Meet the Designers: DAQ Edition
Come meet Garritt Foote, the expert designer and distinguished engineer for DAQ products, and ask your challenging DAQ questions.
Introducing InstrumentStudio Pro: Configuration Measurement Software for PXI
Are you building validation test systems? Learn how to get from instrument set up to automated validation faster with higher level starting points and connected software workflows. In this session we'll show you how to get started with free out of the box instrument configuration and introduce the newest features in InstrumentStudio Professional. Discover how InstrumentStudio Pro, now included in LabVIEW+, can help you decrease development time and increase automation.
Best Practices for Maximizing DC Measurement Performance
Whatever your DUT is, taking quality DC measurements is a cornerstone of electronics test. In this session, you’ll learn key techniques to achieve greater accuracy and throughput in applications requiring DC measurements.
Application Development Sessions
High Speed Serial Link Testing: Two Different Approaches
Testing of high-speed serial interfaces for spacecraft flight equipment is a challenging task that can be successfully addressed by means of PXI FlexRIO architecture. Two approaches to testing WizardLink front-ends will be illustrated based on a PXI High-Speed Serial Instrument and a PXI FPGA Module for FlexRIO with custom designed adapter respectively.
Hardware in the Loop is for Everyone!
Discover how the hardware-in-the-loop approach across design and test can lower costs and significantly reduce development time while dramatically increasing test coverage across industries.
Meet the Designers: RIO Edition
Come meet Kyle Bryson, the expert designer and distinguished engineer for RIO products, and ask your challenging CompactRIO questions.
Leveraging NI Instrumentation for Advanced Applications
Join us for an insightful session led by an esteemed NI Partner, who will delve into the practical applications of NI instrumentation. This session will cover innovative solutions and real-world examples, demonstrating how the NI platform can be utilized to enhance your projects and streamline your workflows.
Kevin Schultz serves as CTO and leader of the Technology and Innovation Office within Emerson's Test & Measurement business group (formerly NI). In this role, he is responsible for driving T&M's long-term, sustainable differentiation through disruptive, customer-focused innovation and the development of foundational architectures and technologies. Kevin joined NI in 1991 as a design engineer, contributing to some of the company's most innovative architectures and products in data acquisition, embedded control, conditioned measurements, precision, and RF spaces. He is the inventor or co-inventor of 25 technical patents, representing his work driving strategic innovation, development, and execution. Prior to taking on the role of CTO, Kevin has served as the R&D Senior Vice President over multiple R&D divisions, including Platform R&D, Segmenting R&D, RF R&D, and Data Acquisition and Control R&D. Throughout his career, he has partnered closely with NI's business leaders to deliver the differentiated technologies and products required by NI's customers. Kevin holds MS and BS degrees in Electrical Engineering from Texas A&M University and St. Cloud State University, respectively. He is a member of the Dwight Look College of Engineering Advisory Council at Texas A&M University.
Rudy Sengupta
Vice President and General Manager, Test and Analytics Software, Emerson Test & Measurement Business Group
As vice president and general manager of the Test and Analytics Software business, Rudy Sengupta is responsible for driving differentiation and resiliency through software and recurring revenue growth for Emerson's Test & Measurement business group (formerly NI). With almost two decades of experience at NI, Rudy has held multiple progressive leadership positions in engineering, product management and strategy. Most recently, he served as vice president of Product Management and Software Growth Strategy, focused on software portfolio transformation and product strategy across a broad product portfolio of RF, precision, conditioned measurement, communication, data acquisition hardware and application software. Prior to that, Rudy held multiple leadership and engineering roles within the R&D organization defining new FPGA-based measurement and control instrumentation and driving execution. Rudy holds a B.S. in Electrical and Computer Engineering from The University of Texas at Austin, with a technical focus on embedded systems and communication networks. He is still engaged with the University as a member of the Electrical Engineering Advisor Board.
Massimiliano Banfi serves as Senior Director of Global Services at NI, Test & Measurement Business Group of Emerson, leading a worldwide team focused on designing, developing, and delivering service offerings that drive customer success in the realm of new technologies, products, and solutions. With a commitment to accelerating innovation, Max oversees support services, hardware services, field service, education services and services portfolio management. Max joined NI in 2001as an Application Engineer and performed in multiple roles, ranging from Systems Engineering, Program Management to Engineering Management bringing a wealth of knowledge to the global services arena. Max holds a master's degree in Aerospace Engineering from Politecnico of Milan. He is a TSIA Advisory Board Member.
Elijay Kerry
Director Software Community
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Allan Solomon
VP of Sales Europe
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Davide Cotterle
Principal Application Engineer
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Anna Pedale
Principal Technical Marketing Engineer
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Fabio Mussi
Chief Applications Engineer, Aerospace, Defense, & Government BU
Andrea Nobile
Principal Applications Engineer, Semiconductor and Electronics BU
Giuseppe Callea
Principal Systems Design Engineer, Transportation BU
Marco Landi
Aerospace & Defense Account Manager
Edoardo Andreini
Senior Field Applications Engineer
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Enzo Perini
Owner, Embyte Oy
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Fabio Intelligente
Engineer, Fabio Intelligente
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Fabio Magnino
Engineer at Pragma Engineering
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Luigi Magni
General Director & System Engineer, Pragma Engineering