NI Days Malaysia 2025

NI Days are back! Innovation, expertise and cutting edge technology!

On 12 June 2025, NI Days return to Penang! Experience an exciting day all about the latest test technologies with expert presentations, practical demonstrations and plenty of opportunities to network with the leading minds in the industry.

The NI Days are our platform for engineers, executives, scientists and industry experts to exchange ideas on current trends and developments in the areas of measurement technology, automation, simulation and validation.

12 June 2025 | 08:30 - 17:30
Eastin Hotel Penang

Technology Updates: Introducing new NI products, solutions, and technologies.
Live demos: Hands-on demonstrations of NI products and software solutions such as DAQ, PXI, LabVIEW or scalable test systems.
Technical lectures: Presentations by NI experts and partners on topics such as test automation, data acquisition or test systems.
Breakout sessions: Tailor-made solutions for your challenges relating to data acquisition, real-time testing, RF, LabVIEW and much more.
Networking: Exchange ideas with industry colleagues and NI experts!

The content will be presented in English.

08:30 - 09:20

Registration W/ refreshment + Expo

09:20 – 9:40

Opening Address

YH Goh, Emerson T&M

9:40 – 10:20

Keynote: Future of Test

Explore how our intelligent test strategy is transforming test and measurement—by giving engineers a more open, flexible, modular, platform that provides differentiated value now and enables success in the future. Also learn more about the future investments being made in the platform to enhance data management and integrate AI.

David Hall , Emerson T&M

R&D Investment

Priya Ramachandran, Emerson T&M

Invited Speaker: Mr. Chin Teik You, Pentamaster

10:20 – 10:40

Break & Expo

10:40 – 11:20

What's New in RF : Vector Signal Transceiver (VST) Deep Dive

This session is an in-depth look at all of the new products and features of NI's VST product line

Ethan Niu, Emerson T&M

11:20 – 12:00

From Requirements to Results: How to Make the Most of AI in NI Software

We will explore how AI assistants can increase your productivity across the Electronics Test Workflow.

David Hall , Emerson T&M

12:00 – 13:15

Expo & Lunch Break (Hotel Restaurant)

13:15 – 13:50

Breakout Sessions view session descriptions

NI Platform: DAQ is Back! Product and Feature Launch Session
Speaker: Adam Dewhirst, Emerson T&M
Industry Application: Testing the Latest Wireless Connectivity Standards
Speaker: Phil Ouyang, Emerson T&M
Software: Choosing the Right Tool when Excel Falls Short: Advanced Data Analysis with NI DIAdem
Speaker: Leon Tan, Emerson T&M

13:50 – 14:25

Breakout Sessions view session descriptions

NI Platform: Unlocking the Power of NI Digital Pattern Instruments
Speaker: Chii Chew, Emerson T&M
Industry Application: Audio & Acoustic Test Solutions – From Lab to Production
Speaker: Tang Min, Emerson T&M
Software: Automated Validation Test with InstrumentStudio Pro and LabVIEW+
Speaker: Grace Ford, Emerson T&M

14:25 – 15:00

Breakout Sessions view session descriptions

NI Platform: Deep-Dive into Software Development for NI DAQ with Python and C/C++
Speaker: Archer Leong, Yeimin Cheah, Emerson T&M
Industry Application: Optoelectronics Testing Including Silicon Photonics and VCSEL
Speaker: Neo Wei Ren, Emerson T&M
Software:AI Boosted Productivity in NI LabVIEW and NI TestStand
Speaker: Ryan Balang, Emerson T&M

15:00 – 15:20

Coffee break & EXPO

15:20 – 16:00

NI Platform: Best Practices for Combining Precision DC Instruments for Higher Voltage or Current

Speaker: Kai Wei, Kean Leng, Emerson T&M

15:20 – 15:35

Breakout Sessions view session descriptions

Industry Application: Optimizing 5G/6G ORAN Network Testing
Speaker: Alex Tseng, Emerson T&M
Software: Reaching your full potential with NI LabVIEW+ Suite & NI Systemlink Software
Speaker: Jing Yang Ng, Emerson T&M

15:35 – 15:50

Breakout Sessions view session descriptions

Industry Application: Power Semi Test Solution

15:50 – 16:05

Breakout Sessions view session descriptions

Industry Application: Enabling Efficient Characterization: An automation Ready Platform for Semiconductor Engineering
Speaker: Sean Chen, Nexolutions Pte Ltd

15:50 – 16:20

Software: LabVIEW vs Python

Speaker: Kingsley Chan, Emerson T&M

16:00 – 16:40

NI Platform: Sneak Peek of NI Platform Roadmap

Speaker: Joey Tun, Emerson T&M

16:05 – 16:20

Breakout Sessions view session descriptions

Industry Application: AINavi x LabVIEW: Accelerating AI Vision Integration Across the NI Ecosystem
Speaker: Phongsit Misa (Diaw), ULTEST

16:20 – 16:40

Breakout Sessions view session descriptions

Industry Application: Detecting Partial Discharge & Leakage with Sound Camera
Speaker: Bin Ni
Software: LabVIEW Community Sharing
Speaker: Kiam Leong, Emerson T&M & Ken Ng , KEC

16:40 – 17:00

Closing Remarks

17:00 – 17:30

Expo

NI Platform Sessions

DAQ is Back! Product and Feature Launch Session

Join us for a new product introduction! The NI DAQ catalog is growing, and we want to give you the latest information on the tools available to help you test and measure your world.

The Future of CompactRIO

Take a peek behind the curtain to see what NI R&D is researching and planning for the next wave of CompactRIO systems. R&D will share high-level investment areas and take questions from the audience.

What’s New in RF Part 1: VST Deep Dive

An in-depth look at all of the new products and features in NI’s VST product line.

Deep Dive into PXI Timing & Synchronization

Examine challenging synchronization scenarios NI has seen in recent years and learn how NI products and APIs address those challenges.

Unlocking the Power of NI Digital Pattern Instruments

Explore key features of NI Digital Pattern Instruments and dive into the Digital Pattern Editor—an interactive tool for importing, editing, and creating test patterns.

Best Practices for Combining Precision DC Instruments for Higher Voltage or Current

Learn techniques for safely stacking or ganging precision DC instruments to reach higher output ranges without sacrificing accuracy.

Industry Application

Electromechanical Test Applications with NI DAQ and LabVIEW+

Explore practical applications in which NI DAQ and software ensure the reliability of electromechanical systems. See how NI hardware, NI LabVIEW, and NI FlexLogger work together in critical scenarios.

Audio & Acoustic Test Solutions – From Lab to Production

Discover comprehensive Audio & Acoustic Test Solutions co-presented by NI and MegaSig.

Optoelectronics Testing Including Silicon Photonics and VCSEL

See how NI supports the optical-device supply chain—from SiPho wafer to component-level test—featuring case studies for EML, VCSEL, MZM, and CPO test solutions.

Testing the Latest Wireless Connectivity Standards

Learn how NI can help you test the latest developments in Wi-Fi 8, Bluetooth LE channel-sounding and high-throughput measurements, and next-generation UWB.

Optimizing 5G/6G ORAN Network Testing

This session will explore the integration of FR2 and FR3 OpenAirInterface (OAI) with advanced technologies such as ORAN, MIMO, and RIS. Participants will gain insight into Dynamic RIS's implementation of the ORAN architecture for intelligent RAN control and MIMO's role in enhancing network capacity and data throughput. It will highlight the application of innovative MIMO, and ISAC/JCAS strategies for beam management and resource allocation. By offering a comprehensive overview of scalable and efficient solutions for next-generation high-frequency networks, the session will offer valuable insights into advanced beamforming, efficient resource allocation, and real-world deployment strategies, making it highly relevant to the microwave technical community.

Using PXI Systems In Power Semiconductor Applications

Illustrate several use cases on how developers can benefit from using PXI systems in power semiconductor applications. Attendees will gain insights into leveraging PXI features to achieve faster test time and better scalability in test setup.

Enabling Efficient Characterization: An automation Ready Platform for Semiconductor Engineering

Explore how Nexolutions and NI jointly enable smarter semiconductor characterization through a fully automated test workflow. This presentation introduces a hands-free platform integrating Nexolutions's Mark-06 handler with NI's PXI/STS systems—designed to improve throughput, stability, and repeatability for lab and R&D environments. Learn how our customizable solutions help engineering teams break free from manual setups, accelerate device testing, and make better, data-driven decisions.

AINavi x LabVIEW: Accelerating AI Vision Integration Across the NI Ecosystem

Discover how AINavi transforms LabVIEW into a powerful AI Vision development platform. Learn how to integrate AI models with NI hardware and vision systems—rapidly, reliably, and without a steep learning curve. Whether you’re in semiconductors, automotive, or research, this session will show how you can turn traditional inspection into intelligent automation.

Detecting Gas Leakage and Partial Discharge with Sound Camera

The session focuses on acoustic cameras for partial discharge and gas leak detection in a non-contact, safe way. Acoustic imaging technology can be significant for ensuring industrial production safety, environmental protection, and economic benefits. Additionally, this session will also cover a quick overview of the use of acoustic cameras in NVH analysis and product noise localization in improving product quality. We will share the principles, advantages, and application cases of acoustic cameras, offering new ideas for industrial inspection.

Software User

Choosing the Right Tool When Excel Falls Short: Advanced Data Analysis with NI DIAdem

Discover how DIAdem excels where Excel falls short—especially with large datasets, waveforms, complex analyses, and advanced visualizations. Join us to explore DIAdem’s specialized capabilities.

Automated Validation Test with NI InstrumentStudio™ Professional and NI TestStand

Accelerate validation testing—from instrument setup to automation—by leveraging the newest capabilities in InstrumentStudio Pro and the NI LabVIEW+ Suite.

AI-Boosted Productivity in NI LabVIEW and NI TestStand

Take a practical look at how NI’s AI assistant, Nigel, can speed up development while using LabVIEW and TestStand—from configuring settings to selecting nodes.

Reaching your full potential with NI LabVIEW+ Suite and Systemlink Software

Let’s explore the possibilities of what you can achieve when you combine the LabVIEW+ Suite and SystemLink. This session will uncover new ways to improve your overall test process in validation and production.

LabVIEW vs Python

LabVIEW or Python? Join this session to compare strengths, trade-offs, and best use cases. Gain insight and real-world tips to choose the right tool for your test strategy!

LabVIEW Community Sharing

Getting to know how NI is working with the LabVIEW Community and sharing of the benefits of being in LabVIEW User Group

In times of AI, rapid technological changes, increasing complexity and ever shorter time to market, the free, one-day event offers you practical insights into the latest tools and methods to solve the technical challenges of today and tomorrow.

Visit us on 12 June 2025 in Penang and shape the future of testing together with us!

12 June 2025 | 08:30 - 17:30
Eastin Hotel Penang

Queensbay, 1, Solok Bayan Indah, 11900 Bayan Lepas
Penang , Malaysia
Conference Room: Eastin Ballroom