Visit National Instruments in booth #740 at IMS 2017
Smarter Microwave Design and Test
Developing next-generation IoT wireless devices and 5G infrastructure is challenging the way we engineer smaller, faster and smarter products. In semiconductor, the push for smaller and more integrated devices is leading to smarter methodologies and flows for RF design and test. In aerospace/defense applications, electronic systems are at a crossroads of increasing system complexity and legacy hardware compatibility that also calls for streamlining product development from early design through production test. To efficiently address all phases of their product development, companies look to the innovative design and test solutions from NI AWR Design Environment, LabVIEW and PXI.
Be sure to attend the following NI speaking sessions:
Panels:
5G Test and Measurements
- Tuesday, June 6
- 3:50-4:30pm
- 311
The Future of RF Semiconductor Test
- Wednesday, June 7
- 12:00 – 1:00 pm
- MicroApps Theatre
Microapp Sessions:
mmWave Test Architectures: Superhet, Direct-Conversion or Hybrid Designs - Which Will Dominate?
Multiple-Input and Multiple-Output (MIMO) and Beam Steering Modeling in the VSS System Simulator in Support of 5G Applications
Tomorrow’s Wireless: How 5G and the IoT is Shaping the Future of Wireless Technology
Workshop:
Synthesize and Build a Custom HDTV Antenna
- Wednesday, June 7
- 3:00-5:00pm
Lastly, be sure to join us at our annual Customer Appreciation Event!
Learn more about the event
here.