October 29, 2020 - (GMT+01:00) Brussels, Copenhagen, Madrid, Paris Keynote 3:00–3:30 p.m | The Future of Semi Test
Ritu Favre, NI | 6:30–7:00 p.m. | *The Future of Semi Test
Ritu Favre, NI *A repeat keynote for different timezone participants |
Mixed Signal Track - Live Sessions3:30–4:00 p.m | Simplify Semiconductor Device Control
Mike Watts, NI; Marvin Landrum, NI Nearly every mixed-signal semiconductor device requires some type of hardware or device control, ranging from basic static DIO to complex register reads/writes. This device control functionality allows design engineers, systems engineers, and validation engineers to bring up new silicon, perform interactive debugging, and begin the task of validating the design. During this session, we will discuss some of the challenges associated with device control and demonstrate how InstrumentStudio has been expanded to offer device control capabilities will make it easier to perform interactive and automated validation of mixed-signal ICs. | 4:00–4:10 p.m. | Break | 4:10–4:40 p.m. | Optimize Semiconductor Power Efficiency Measurements Mike Watts, NI As the demand for energy efficiency grows, collecting, quantifying, and comparing power consumption of semiconductor devices is becoming a non-trivial task. NI’s Semiconductor Power Validation Solution enables engineering teams to quickly measure, collect, and analyze power consumption of pre- and post-production devices in order to provide accurate and relevant feedback to designers and potential customers. | 4:40–5:10 p.m. | Improve WLR System Performance to Enhance Your Reliability Decisions Joris Donders, NI; Karen Armendariz, Celadon; Eric Wilcox, FormFactor Reliability and wafer level reliability are time consuming tasks but required to develop good models and PDKs. During this session attendees will learn about ways to improve and enhance their reliability setups so that it allows them to gather the desired amount of statistical data required | 5:10–5:20 p.m. | Break | 5:20–5:50 p.m. | Tips and Tricks for Better SMU Measurements Austin Stanton, NI Source measurement units (SMU) are gaining popularity due to their ability to consolidate the functionality of a programmable power supply, programmable load, and DMM in a single instrument. However, most engineers have only scratched the surface on the impact that an SMU can make on their test system performance and throughput. With the ultimate goal of reducing both cost and test time, these tips will have you on your way to characterizing and validating your products faster and more economically. | 7:00–7:30 p.m. | *Simplify Semiconductor Device Control
Mike Watts, NI; Marvin Landrum, NI *A repeat session with Live Q&A for different timezone participants Nearly every mixed-signal semiconductor device requires some type of hardware or device control, ranging from basic static DIO to complex register reads/writes. This device control functionality allows design engineers, systems engineers, and validation engineers to bring up new silicon, perform interactive debugging, and begin the task of validating the design. During this session, we will discuss some of the challenges associated with device control and demonstrate how InstrumentStudio has been expanded to offer device control capabilities will make it easier to perform interactive and automated validation of mixed-signal ICs. |
Wireless Track - Live Sessions3:30–4:00 p.m. | Achieve Lab-Grade RFFE Validation Results with Production Test Speed Alejandro Buritica, NI Engineers working on RF front ends for wideband standards, like 5G and Wi-Fi 6, must validate new RF front-end devices over more frequency bands, carrier-aggregated scenarios, and increasingly complex modulation schemes. With markets demanding greater efficiency and linearity, engineers need to validate design performance with the latest digital predistortion (DPD) algorithms and tightly synchronized envelope tracking (ET) configurations in 50- and non-50 Ω environments. Learn how the NI RFFE Validation reference architecture helps engineers simplify and speed up the process of device bring-up, interactive validation, and automated characterization with extensive test sequences. | 4:00–4:10 p.m. | Break | 4:10–4:40 p.m. | Future of Connectivity: Wifi6 and Wifi7 Alejandro Buritica, NI The next generation of wireless connectivity is already under development. Much more than a scaled up version of Wi-Fi 6, the new Wi-Fi 7 standard promises tens of Gbps data rates, support for time-sensitive applications, multi-link synchronization, advanced PHY and MAC techniques, and cooperation among access points. This presentation will introduce 7 key innovations of Wi-Fi 7. | 4:40–5:10 p.m. | Address the Challenges of 5G OTA Validation from DFF to IFF Alejandro Buritica, NI 5G mmWave beamforming antenna modules and system-level designs require fast and accurate Over-the-Air (OTA) validation to determine their beamforming performance. This presentation introduces several real and practical challenges of OTA test, as well as an innovative solution for fast mmWave OTA characterization and validation. | 5:10–5:20 p.m. | Break | 5:20–5:50 p.m. | Accelerate 5G mmWave Beamformer Test Yuka Muto, NI; Mike Mayberry, NI A beamformer is a a critical part of a mmWave device, but its test can be time-consuming. In this presentation, we will discuss the basics of validating and characterizing the beamformer performance, and how a multi-channel vector signal transceiver can reduce the test time and complexity. | 5:50–6:20 p.m. | Speed Up Your Load Pull Test Vince Mallette, Focus Microwaves In this presentation we will discuss the latest developments in high speed load pull. Use cases for both passive and active load pull will be described. Focus will be presenting a novel technique using National instrument’s PXIe VST to perform high speed CW/Pulsed as well a wideband load pull for NR modulated signals. | 7:00–7:30 p.m. | *Achieve Lab-Grade RFFE Validation Results with Production Test Speed Alejandro Buritica, NI *A repeat session with Live Q&A for different timezone participants Engineers working on RF front ends for wideband standards, like 5G and Wi-Fi 6, must validate new RF front-end devices over more frequency bands, carrier-aggregated scenarios, and increasingly complex modulation schemes. With markets demanding greater efficiency and linearity, engineers need to validate design performance with the latest digital predistortion (DPD) algorithms and tightly synchronized envelope tracking (ET) configurations in 50- and non-50 Ω environments. Learn how the NI RFFE Validation reference architecture helps engineers simplify and speed up the process of device bring-up, interactive validation, and automated characterization with extensive test sequences. |
Enterprise Track - Live Sessions3:30–4:00 p.m. | Break Down Barriers From Design to Test George Zafiropoulos, NI Cross-functional collaborations typically contribute to organizational efficiency which in turn drives business results. During this session we will cover how we are strategically collaborating with key partners to build a software platform that allows companies to go on the journey of improving cross-functional collaboration throughout their entire product development cycle. | 4:00–4:10 p.m. | Break | 4:10–4:40 p.m. | Panel: Driving Innovation with a Modern Lab Approach Moderator: Michael Schneider, NI
Key panelists:
Michael O'Sullivan, General Manager, Analog Devices
Christian Paintz, Central Engineering Silicon Manager, Melexis
Marvin Landrum, NI As the pace of innovation continues to accelerate in the semiconductor industry, change is needed in today’s validation and test labs in order to keep pace with breakthrough innovation. Join a panel of renowned semiconductor leaders to discuss how key investments in the validation lab through people, process and technology result in better organizational efficiency ultimately driving improved product quality, faster time to market, and increased collaboration across their companies. | 4:40–5:10 p.m. | From 5G to 6G: Understanding the Next Generation of Mobile Communications Moderator: David Hall, NI Key panelists: Dr. Volker Ziegler, 6G Leadership Nokia Bell Labs & CTO Joe Madden, President of Mobile Experts
Charles Schroeder, Head of Wireless Long Term Development Initiatives and Fellow at NI Although 5G devices and infrastructure are just beginning to roll out en masse, in dustry and academic partners are beginning to look forward to the next generation of wireless communications - 6G. For many, the big question is:"What is 6G…and what applications will it enable?" In this session, well chat with several leading industry experts about 6G use cases, timelines, and potential enabling technologies. | 5:10–5:20 p.m. | Break | 5:20–5:50 p.m. | Ways to Improve Operational Efficiency of Your V&V Labs Ray Hsu, NI During this session we will introduce you to 3 ways to eliminate hidden inefficiencies in your V&V test operations. We will share thoughts, ideas and possible ways to implement improvements to test bench management and gain valuable insights in utilization of all your test assets. We will also discuss effective ways to monitor test activity in order to be more proactive in prevented potential issues. | 5:50–6:20 p.m. | Enable Machine Learning Approaches to Semiconductor Data Alon Malki, NI Machine Learning (ML) Technologies offer a great opportunity to optimize the time spend on leveraging data to gain insights, improve overall decision making, efficiency and quality. During this session we will explain how the right infrastructure is an important enabler for leveraging machine learning in industrial applications and highlight a few case studies. | 7:00–7:30 p.m. | *Break Down Barriers From Design to Test George Zafiropoulos, NI *A repeat session with Live Q&A for different timezone participants Cross-functional collaborations typically contribute to organizational efficiency which in turn drives business results. During this session we will cover how we are strategically collaborating with key partners to build a software platform that allows companies to go on the journey of improving cross-functional collaboration throughout their entire product development cycle. |
On-Demand Sessions - Access AnytimeWhat’s New in LabVIEW Daniel Parrott, NI | Data Acquisition 101: How to Spec and Select Your Next DAQ System Kristoffer Iversen, NI | Is FlexRIO right for you? Austin Stanton, NI | What’s new in PXI Austin Stanton, NI | More content coming soon... |
Networking5:50–6:50 p.m. More agenda coming soon... Please note that this agenda is still subject to change.
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