< title> RF & Wireless Technology Day 2017 - National Instruments

Location & Hotel

Terms & Conditions

Agenda

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User and Technology Presentations

08:30	Registration
09:00	Welcome
09:15	Test Solutions for IoT and Connected Car Products Manuel von Helden, NOFFZ Technologies
09:45	Evolving Your RF Test Capability for Next Generation RF Applications Ram Mirwani, National Instruments
10:15	Coffee Break / Exhibition
10:45	Radar Target Simulator and Testing in Validation & Production Ronald Kaempf, WKS Informatik GmbH Markus Solbach, NOFFZ Technologies
11:20	Next Generation RF Test System for Automotive Ram Mirwani, National Instruments
11:55	From Monitoring to Parameter Tester – One Tester Platform for Connected Gateways Markus Zillich, Andre Kolbe, Lear Corporation GmbH Lucas Litjens, NOFFZ Technologies
12:25	Lunch Break / Exhibition
13:20	BaseStation Simulator for NB IoT and Cellular Product Validation Jörg Holfeld, Fraunhofer Institute IVI, Dresden Mátyás Süveg, NOFFZ Technologies
13:55	Multi DUT Production Testing with NI WTS on Infotainment / Navigation Systems Dieter Vreyborg, e.solutions Carsten Sckopke, NOFFZ Technologies
14:30	Interference Simulation for Intelligent Transportation Systems - Vulnerability Analysis Stephane Hamel, Skydel Solutions
15:00	Coffee Break / Exhibition
15:30	V2NI – (Car2X) V2X With the National Instruments Platform Gerd Schmitz, S.E.A. Datentechnik GmbH
16:05	Simplifying RF Tests for cost effective production of IoT, Home Automation and Automotive Devices Oliver Poos, NOFFZ Technologies Markus Solbach, NOFFZ Technologies
16:35	Get-Together / Exhibition

Workshops*

* Please note that workshop seats are limited and that you need to register onsite to be able to attend.

08:30	Registration
09:00	Welcome
09:15	Test Solutions for IoT and Connected Car products Manuel Bogedain, NOFFZ Technologies
09:45	Evolving your RF Test Capability for Next Generation RF Applications Ram Mirwani, National Instruments
10:15	Coffee Break / Exhibition
10:45	Workshop: Efficient Parallel Testing of Wireless Devices Using the NI Wireless Test System Part 1: Presentation and Live Demo Udo Dehne, National Instruments Sascha Hoener, National Instruments
12:25	Lunch Break / Exhibition
13:20	Workshop: Efficient Parallel Testing of Wireless Devices Using the NI Wireless Test System – Instrument UI, WTM & DUT Control Part 2: Hands-on Session Jan Møller, National Instruments Mátyás Süveg, NOFFZ Technologies
15:00	Coffee Break / Exhibition
15:30	Meet the RF Experts – Discussion of Typical RF Challenges and WTS Feedback Round Jan Møller, National Instruments Mátyás Süveg, NOFFZ Technologies Dirk Eyckmanns-Wolters, NOFFZ Technologies
16:35	Get-Together / Exhibition