Keynotes (& arrival)08.00 - 09.00 | Registration & Exhibition | 09.00 - 10.15 | Morning Keynote - Testing and Deploying the Next Generation of Technology Creating the hyper connected world of tomorrow presents many challenges today. By developing and testing rapidly changing technology, engineers and scientists are pushing the boundaries of innovation and accelerating the pace of design. Learn how the NI platform is accelerating innovation in applications ranging from transportation safety, wireless communication, space travel, and the Internet of Things. | 10.15 - 10.45 | Refreshments & Exhibition | 13.45 - 14.30 | Afternoon Keynote - The Next Innovation in Engineering Software Software has been at the heart of the NI platform for over 30 years. See how NI continues the LabVIEW legacy with the evolution of the world’s most productive and efficient engineering software. From simplifying complex pin-to-analysis workflows to creating an architecture that will facilitate massive codebases and distributed systems, the future of engineering software has arrived. Stuart Dawson, Chief Technology Officer at University of Sheffield’s Advanced Manufacturing Research Centre (AMRC)
Hear Stuart Dawson discuss how super-trends, like Industry4.0, energy and the electrification of transportation, are changing the way we live and work. Following 25 years of experience in the nuclear & aerospace sectors, Stuart is now Chief Technology Officer at the AMRC, enabling manufacturers of any size to become better, faster, cheaper and greener through the introduction of advanced manufacturing techniques. |
Software Track10.45 - 11.30 | What's New in LabVIEW? by National Instruments The LabVIEW you know is changing. NIWeek 2017 marks a key inflection point in the history of LabVIEW. Explore new technologies that will fundamentally improve how you engineer your systems while receiving updates on the same LabVIEW that you know and love today. Learn what these innovations mean for you and how you can take advantage of them. | 11.30 - 12.15 | Best Practices For Transitioning To LabVIEW NXG by National Instruments For existing LabVIEW users interested in learning more about how to transition their skills and code to LabVIEW NXG, this session will discuss best practices for when and how to adopt LabVIEW NXG.
Learn about the tools, support, and processes in place to ensure that your transition to LabVIEW NXG is successful. | 12.15 - 13.00 | Managing Distributed Deployed Systems Efficiently by National Instruments Explore NI's systems management product that enables the mass coordination of connected devices, software deployments, and data communications throughout a distributed or deployed system. The software provides a web interface to centrally manage and coordinate systems management functions on distributed PXI and CompactRIO systems. | 13.00 - 13.45 | No Session in this time slot | 13.45- 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exibition | 15.00 - 15.45 | Understanding How Elephants Communicate Using an Infrasound Monitoring System with LabVIEW NXG by Chris Garratt and David Catto, Austin Consultants As part of their new £2m Centre for Elephant Care, the Zoological Society of London wanted to integrate technologies that could visualise the deep, infrasonic communications between the resident elephant herd. Using NI LabVIEW and CompactDAQ, we developed a unique infrasonic monitoring system with precise acquisition, signal processing and web-based visualisation. Now on permanent display at the Centre of Elephant Care, the system engages and educates the zoo-going public on how these magnificent creatures communicate. We have subsequently re-engineered this solution utilising LabVIEW NXG and will compare key advantages of using LabVIEW NXG vs LabVIEW 2015 in this session. | 15.45 - 16.30 | The Future of Web Application Development in LabVIEW by National Instruments As Test, Measurement, Control and Monitoring systems scale and get distributed, Scientists and Engineers like you are looking to Web technology to create portable, cross platform solutions. In this session, we will discuss considerations such as Web standards, hosting, security, access management and data communication and demonstrate how upcoming offerings from NI will enable you to integrate Web Technology into new and existing applications in a familiar yet powerful way |
Industrial Internet of Things Track10.45 - 11.30 | Paving the Way for Industry 4.0 with Smart, Reconfigurable Manufacturing Machines
by Jeff Morgan & Garret O'Donnell, Trinity College Dublin Today the world is on the verge of a 4th industrial revolution, “Industry 4.0”, which will produce smarter, more adaptable, reconfigurable manufacturing machines. These machines will not only improve how manufacturers operate, but how they visualise their production process. The manufacturing engineering research team at Trinity College Dublin have been exploring these themes through the development of an innovative reconfigurable automated product testing line. This session will explore the projects development, including; design requirements, project challenges, hardware/software architecture, and commercial impact. | 11.30 - 12.15 | The Measureable Business Impact of the NI Embedded Design Platform
by National Instruments Developing, and deploying complex machines and equipment on time, and with limited resources is a challenging task. Learn how NI’s accelerated custom embedded design platform allows you to focus on innovation and competitive differentiation while leaving the foundational elements of your embedded design behind. | 12.15 - 13.00 | Machine Learning for Industrial IoT
by Philippe Lambinet, Cogito Instruments | 13.00 - 13.45 | Practical Guide to Connecting LabVIEW to Industrial IoT Platforms by National Instruments For many LabVIEW developers and engineers without specific IT background the question remains how to connect their devices and applications to the IIoT and the associated cloud tools, (like Amazon Web Services and IBM Bluemix). We'll cover some of the concepts and IIoT protocols and show how you can program your embedded system to connect to these cloud applications. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Time Critical Network Communication for Industrial Robots by Peter Whiteley, Metis Automation Robotic devices that work autonomously in harsh environments need robust communications systems with accurate timing information. In this session, we will discuss practical strategies and examples for device communication in time critical situations. | 15.45 - 16.30 | Using NI Tools to Push into Industry 4.0
by Stephen Bowles and Adrian Hirst, AMRC In this talk we intend to give an overview some of the R&D work enabled at the AMRC by NI equipment, the unique problems it helped solve, and the benefits gained. First, we will cover the aims of the AMRC in general, and the developments in Factory 2050 in particular. We will then go onto 3 recent case studies that should show how NI software and hardware has filled a specific need during projects that could not be easily accomplished any other way. These case studies will cover a wide variety of fields, including direct motor control, IoT interactions, AR and VR, and offline simulation; as well as multiple industries (Civil Aircraft, Military Aviation, and Construction). In each we will give an overview of the industrial challenges our partners faced, the solutions we developed, and a deeper dive into how the specific NI kit was used to rapidly meet some complex requirements. Finally, we will conclude with an overview of where these research projects are going, and where NI equipment and software will fit in industrial research in the future. | 15.45 - 16.30 | Taking place in Big Data Management Room Turning IIOT Asset Data to Actionable Information Using Analytics
by National Instruments Data is the new oil. It's valuable but if unrefined, it is just data. How can you generate more value from your data? NI is a leader in the acquisition of Big Analog Data. Discover how tools within the NI monitoring ecosystem can help refine this raw data into actionable information to help drive predictive analytics. |
Validation & Verification Track10.45 - 11.30 | The Convergence of Aerospace and Automotive Test
by National Instruments Both the Aerospace and Automotive industry are facing an increase in complexity outside of their traditional areas of expertise. During this session, we will discuss the mega-trend convergences of these industries, and what can be learnt from each other to meet these needs. We will consider the following: Mega-trend similarities between the industries (Electrification, connectivity, sensor fusion), overview of model based test approaches, interoperability and open standards that can reduce the cost of test. | 11.30 - 12.15 | LabVIEW-Based Training Simulator: North Sea Diving by Andy Clegg, ISC Industrial diving in the North Sea is a highly safety critical application. Any loss of pressurisation or problem with the breathing gas mixtures can very quickly lead to serious consequences, and these are managed by highly trained and experienced Dive Supervisors and Life Support Technicians. ISC is involved in the development of a state-of-the art training simulator for these operators, with realistic control panels, audio/video and even VR to create immersive and realistic training scenarios. The important dynamic models of process equipment and breathing gasses are built in LabVIEW and then embedded into the main C# application. | 12.15 - 13.00 | The Challenges of Testing Multi-Sensor Systems by National Instruments Because systems increasingly rely on sensor fusion techniques, the test requirements are growing even more complex at a fast rate. A test system built on a scalable and flexible architecture is the only way to make sure you can adapt quickly. In this session, we will discuss test methodologies for addressing requirements such as model generation, sensor and model synchronisation and more, using Advanced Driver Assistance Systems (ADAS) technologies and autonomous vehicle systems as a case study. | 13.00- 13.45 | Advanced Techniques for Model Based Design Using Veristand by Colin Freeman, Frazer-Nash Consultancy Model Based Design plays a key role in the modern systems engineering life-cycle, reducing both development time and costs. The session will demonstrate the benefits of using Veristand in conjunction with industry standard modelling tools (Simulink/SCADE/LabVIEW) to implement a safety critical control system using Model Based Design. It will use a practical demonstration to cover tips, common pitfalls and best practice. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Standardising the HIL Signal Path with SLSC by National Instruments For years, test engineers have taken advantage of the lower price, outsourced risk, and easy upgradability of commercial off-the-shelf (COTS) components for their data acquisition. Until now, however, they’ve lacked good solutions for the other half of their test challenge: Switches, Loads, and Signal Conditioning (SLSC). SLSC is the first open architecture designed to deliver all these benefits while supporting the integration of custom circuitry and load plates by being fully open. Learn how SLSC is helping companies focus on their domain expertise, building and testing next-generation vehicles, rather than on building and maintaining data acquisition systems. | 15.45 - 16.30 | Efficient Testing of the World's Most Cost-Effective Fighter Plane by Niklas Krakau, Saab Aeronautics Changing from in-house developed I/O systems and solutions to commercial off the shelf solutions is a big challenge not only from an engineering perspective. Important factors for success proved to be not only focusing on technology but on management, personnel and decision-making as well.
Looking back a few years in time, what has been our success factors in this transition? What technology and platforms do we use and what advantages do we see in the SLSC-platform? What are the challenges and strengths in combining custom and COTS?
Regarding hardware in the loop simulation the future is now! How do we benefit as much as possible from technology advances? |
Test & Measurement Track10.45 - 11.30 | A 5-Step Plan to Ensure Test Success
by Phil Rawlings, Simplicity AI Delivering effective test solutions on-time and on-budget involves more than just selecting the right tools. This session explores the entire lifecycle from planning though to development, deployment and maintenance - highlighting real-world experiences and emerging trends. Learn the techniques used by Simplicity AI to provide effective test solutions while at the same time reducing risk. | 11.30 - 12.15 | Best Practices for Architecting an Automated Test System
by National Instruments Constantly evolving threats and technologies in today's aerospace and defence electronics requires a smarter method for automated test. Learn how NI's software-centric approach can help you lower your cost of developing and maintaining advanced systems. | 12.15 - 13.00 | Signal Testing in the Technology Fast Lane
by Arnoud de Kuijper, Averna All the latest consumer, safety and connectivity technologies like WiFi, radar/lidar, navigation and V2V are merging in the modern automobile, bringing considerable development, test and quality challenges for automotive OEMs and their suppliers. This presentation gives an overview of the major technical issues facing connected-car developers such as emerging technologies, regional standards, accelerated development/integration cycles and evolving vehicle-safety initiatives. As an example of how to solve these challenges, we discuss a standardized, scalable and modular test approach based on NI products and integrated NI Partner solutions, including a real-world setup that covers radio, navigation, video and connectivity test cases for different regions. | 13.00 - 13.45 | Simplify Standardisation and Reduce Risk with ATE Core Configurations
by National Instruments Learn about new NI ATE System Components including 19” racks, power distribution units, and other common ATE hardware along with new ATE Core Configurations that integrate core mechanical, power, and safety infrastructure for an ATE rack to streamline design and reduce lead-times. Experience the online configurator to customize your system. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | 7 ways LabVIEW NXG can help you with your Test and Measurement System
by National Instruments This session will look at LabVIEW NXG 2.0 in more detail and see how it can help you create your next test system faster. | 15.00 - 15.45 | Taking place in Big Data Management Room Are traditional SPC tools the right choice for finding quality issues in electronics manufacturing? by Vidar Gronas, Virinco A popular method for quality control in manufacturing of electronics products is using SPC (Statistical Process Control). SPC is widely used in continuous processes to calculate control limits and to detect out of order process parameters. By applying this method in production of electronics you are making assumptions about the process that may be wrong. For instance your calculations will be correct if the process parameters you are monitoring are stable. | 15.45 - 16.30 | Standard Test Platforms and Architectures by Tom Adams, TBG Solutions TBG Solutions have been delivering automated test systems for 16 years. In that time, we identified many common features and functions that are universal. By creating a generic test architecture, we have reduced development time and cost whilst improving the scalability, flexibility and function of our best in class solutions. By leveraging the powerful TestStand and LabVIEW platforms we designed an architecture for automated test as a standard toolkit that we can customise for our customers. |
Data Acquisition Track10.45 - 11.30 | Live Demo: Programming a Distributed DAQ Application
by National Instruments The best way to learn is by doing, so this session will have no slides! Explore the new capabilities of LabVIEW as we build a synchronized, mixed signal DAQ application from the ground up using best practices for getting started quickly, correctly setting up your DAQ task, capturing metadata, and maintaining reliable operation. | 11.30 - 12.15 | Developing a Synchronised Distributed Data Acquisition System by Dr Emma Hudson, University of Exeter Acquiring sensor data on large structures presents a unique set of challenges that often only a distributed data acquisition system can overcome. However, great care is needed to ensure that this distributed system is properly synchronised so that effective post-processing of the data is possible. This talk discusses the development of such a system using multiple NI CompactRIO units with oven-controlled crystal oscillators and its successful application on one of the longest span suspension bridges in the world. | 12.15 - 13.00 | How to Architect your DAQ System for Signal Processing
by National Instruments Analysing data inline with your acquisition can generate valuable insight during a live test. However, the processing time of lengthy calculations can negatively affect data transfer. Explore best practices for parallel analysis architectures to avoid common pitfalls such as buffer overflows or an unresponsive UI. | 13.00 - 13.45 | Controlling a State of the Art Wind Tunnel Using LabVIEW RT & PXI
by Simplicity AI & Imperial College London As part of the National Wind Tunnel Facility initiative, the Imperial College London 10x5 tunnel underwent a major upgrade which included replacing the control and data acquisition systems with LabVIEW and NI hardware. This reconfigurable tunnel which provides 2 large test sections and includes a rolling-road, is used for aerodynamic development of race and road cars, buildings and other structures. Learn more about what this state-of-the-art facility provides and how NI technology enables users to make maximum use of it.. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Automated Testing of Sensors 5000 Miles Away Using LabVIEW & CompactDAQ by Tim Wiles, Peratech Peratech’s challenge is having a head office in the UK, but a growing manufacturing base in Asia. Sensors coming off the production line in Asia need to be tested quickly and accurately, but the data must be visible to team members in the UK, and around the world, in close to real-time. See how LabVIEW & CompactDAQ have contributed to achieving this goal, helping maintain visibility in production, while aiding in remote problem solving, increasing efficiency and reducing costs. | 15.45 - 16.30 | Technology Roadmap for NI DAQ Hardware and Software
by National Instruments Review of the main NI data acquisition form factors and their common use cases. Also explore new NI DAQ hardware and software and the opportunities they offer for extending application functionality and improving design worklfows. Lastly, glimpse into the future at the NI DAQ technology debuting in the next few years. |
Big Data Management Track10.45 - 11.30 | The Fundamentals of Data Management by National Instruments Almost every engineer and scientist must collect and anlyse data. However, only a few of us manage our data in a way that makes searching and analysing data quick and simple. In this session we're going to take a look at the challenges of efficiently managing data and learn more about the key to unlocking an easier way - metadata. We'll see the benefits metadata and a good data management system can bring and look at some simple LabVIEW techniques you can introduce to improve your metadata. | 11.30 - 12.15 | Workshop: Make Your Data Life Cycle More Efficient by National Instruments What is the life cycle of your data? Join us for this hands-on workshop to explore your data collection and analysis practices to ensure you're using your data as efficiently as possible. With the help of our data management experts, you will be able to come away with a good overview of your data analysis process and practical steps to implement to make your it simpler and more effective. | 12.15 - 13.00 | 5 Steps You Can Take to Make Better Decisions From Your Data by National Instruments No matter the size of the application, on average only 5 percent of the data being collected is analyzed. Learn how to break down the data analysis process into five steps while exploring the NI tools that can help you manage and analyze your engineering data. | 13.00 - 13.45 | Telematics Data Management Gareth Gough, Caterpillar Caterpillar collects a substantial amount of discrete and continuous data on a daily basis, from machines all over the planet; and continuous data from engines in test-cells at several locations across three continents. The management of continuous data (time-series data logged at sub-second intervals) can be especially challenging. Furthermore, continuous data is stored in a variety of formats and often on another continent to the consumer. Historically, Caterpillar engineers have spent a disproportionate amount of time locating, copying, concatenating and converting data; with approximately 80% preparation time, 20% analysis time. The aim is to reverse this ratio. With NI software, Caterpillar are now able to automatically concatenate and convert data into a common format, run calculations and enrich the data with additional properties, then index the data to make it searchable. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Are traditional SPC tools the right choice for finding quality issues in electronics manufacturing? by Vidar Gronas, Virinco A popular method for quality control in manufacturing of electronics products is using SPC (Statistical Process Control). SPC is widely used in continuous processes to calculate control limits and to detect out of order process parameters. By applying this method in production of electronics you are making assumptions about the process that may be wrong. For instance your calculations will be correct if the process parameters you are monitoring are stable. | 15.45 - 16.30 | Turning IIoT Asset Data to Actionable Information Using Analytics
by National Instruments Data is the new oil. It's valuable but if unrefined, it is just data. How can you generate more value from your data? NI is a leader in the acquisition of Big Analog Data. Discover how tools within the NI monitoring ecosystem can help refine this raw data into actionable information to help drive predictive analytics. |
Business & Technology Track10.45 - 11.30 | Automated Test Outlook
by National Instruments One of the biggest challenges for test engineers and managers is staying up to date on technology trends. NI has a broad knowledge of these trends and interacts with companies across many sectors, which gives us a unique view on the test and measurement market. Join us to go through 5 recent trends in the test sector that you can take advantage of to increase efficiency. | 11.30 - 12.15 | Growing Strong, Confident, Innovative Teams
by National Instruments Increase long term productivity and reduce unexpected downtime by investing in software proficiency with your teams to ensure a consistent and reliable approach to test software development. Learn how National Instruments can help you set out key software engineering processes for your development team to follow – and gain the Centre of Excellence certification to validate the team is achieving goals such as reduce cost of test, improve efficiency, improve quality and create a culture of innovation. | 12.15 - 13.00 | Improve Measurement Accuracy in your Application by National Instruments Using existing equipment, measurement accuracy can be improved through characterization. This presentation outlines common sources of error in a measurement system, and techniques for evaluating and improving the overall accuracy. In addition, we will review specific examples of RF and DC system-level applications of these techniques. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External Speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition |
Semiconductor Track13.00 - 13.45 | Parametric Testing for Next-Generation Semiconductor Technologies by Bart De Wachter, IMEC Imec partners with the largest semiconductor foundries to develop new process technologies that anticipate the latest industrial needs. Explore some of imec’s advanced semiconductor research and discuss how imec uses the PXI platform, the PXIe-4135 SMUs and LabVIEW to build an accurate and fast parametric tester in the 300mm wafer FAB to characterize these new technologies. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External Speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Accelerate Mixed Signal Testing of Semiconductor Devices with NI PXI SMUs and Digital Instruments
by National Instruments Two critical vectors of semiconductor test are DC power behavior and digital bus and protocol function. SMUs are incredibly versatile DC instruments that you can reconfigure for high-precision or high-speed measurements. Digital test capability can be difficult to provide with ATEs throughout the test process. See how versatile PXI SMUs and ATE-class PXI Digital Pattern Instruments are bringing characterization, validation, and production test capability to the PXI platform. | 15.45 - 16.30 | Advanced PA Test Techniques for DPD, ET and Measurement Acceleration
by National Instruments Technologies like carrier aggregation, digital pre-distortion (DPD), and envelope tracking (ET) are increasing the complexity of modern RF front end module test. Engineers must use progressively more sophisticated test practices to characterize modern RFICs without increasing test cost. We will share best practices for testing carrier aggregation, DPD, and ET configurations. We will explain various techniques for improving test time, choosing the appropriate DPD model, and addressing synchronization challenges in ET test configurations so you can be better prepared for the test challenges of modern RFICs. |
Academic Track10.45 - 11.30 | Sparking Innovation in the Engineer of Tomorrow
by National Instruments The engineering challenges we’re addressing today are ever-expanding, pushing our limits past what we thought possible. Being at the forefront of these innovations, NI and other industry leaders are looking to the engineers of tomorrow to keep pace with rapid change, and deliver upon the world-changing outcomes that inspires each student in every engineering program. take us to the next level. But we don’t expect anyone to do it alone. Together we must accelerate the rate of discovery in engineering education through cutting-edge engineering system design—developing engineers who are ready to tackle new challenges we have not even dreamed of yet, through the Internet of Things, mechanical automation, and wireless communications. Hear how elite educators around the world are partnering with NI to “future proof” their teaching and research programs and lead students to engineer whatever comes next - faster. | 11.30 - 12.15 | Take Full Advantage of the NI Academic Program
by National Instruments NI's Academic Program is one of the best in the world, encompassing everything from training and collaboration to sponsorships and awards. Join us to discover the diverse initiatives that make up the NI Academic Program, and learn how they can benefit you, your students, and your University. | 12.15 - 13.00 | A Showcase of Student Innovation
by Various Undergraduate Speakers Mars Rovers? Dementia care systems? Pipeline inspection robots? Electric Motorbikes? Eco-cars? Beer pouring robots? This year, we've witnessed awe-inspiring undergraduate innovations. We've handpicked three, award-winning students to demonstrate their final year projects and tell you what their really think about NI tools in the learning experience. | 13.00 - 13.45 | Academic Lunch Break | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speakers Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition |
Wireless Prototyping Track13.00- 13.45 | Combining Passive WiFi Sensing and Machine Learning Systems to Monitor Health, Activity, and Well-Being Within Nursing Homes by Dr Bo Tan, Coventry University Healthcare has become one of the biggest social and economic issues of our time for compelling reasons, such as aging populations. The need to assist people with disabilities, chronic disease, dementia, and mental health issues places increasing demands on limited resources for around-the-clock monitoring of activity, health, and well-being, especially within residential healthcare. We used LabVIEW and USRP to create a passive WiFi sensing system that can detect body movements and vital signs of a subject through walls and without any physical contact. The detailed analysis of the WiFi signals that reflect off a patient reveals patterns, which can be served up to gesture recognition libraries and machine learning systems for classification of activities and model lifestyle behaviour for healthcare applications. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | A Status Update of The Technologies Behind 5G
by National Instruments 5G has the potential to transform lives and unlock economic value. It promises benefits but also presents technical and system challenges with a goal of developing a commercially viable, multivendor standard. To expedite commercialization, researchers must prototype 5G concepts to assess the technical and economic practicality of specific research. | 15.45 - 16.30 | Using LabVIEW Communications to Increase Spectral Efficiency for Wireless Communication by Seyed Ali Hassani, KU Leuven |
LabVIEW Power Programming Track11.30 - 12.15 | Our Love Hate Relationship with Templates and Frameworks
by Dawid Wozny, Argenta Over the years we have used a number of different frameworks for developing our solutions and also delved into template LabVIEW projects as a starting point for our solutions. We’ve had some good and some bad experiences that we would like to share. We’ll talk about the frameworks we have used, how they have affected development and what we are currently using. We would also like to share our experience of templates and discuss how we have loved and hated them! | 12.15 - 13.00 | The Journey of the KR State Machine, from Idea to Tools Network
by Kevin Ross This presentation will guide you through the process of preparing a LabVIEW tool for the LabVIEW Tools Network, using a tool I have developed, “KR State Machine”, as an example. KR State Machine provides a simple and pragmatic modular approach to software development. The easy to use tools assist in project creation through the help of VI Scripting, which will improve development time. I will demonstrate how the KR State Machine works and how the tools work. I will then show you how to create Documentation, an Example, add a project to the LabVIEW splash screen and create VI Packages through VI Package Manager, which are all steps required to create a quality tool. Finally I will point you in the direction of some useful information for how you can turn your idea into a LabVIEW Tools Network product | 13.00- 13.45 | Zero to Continuous Delivery using Jenkins Declarative Pipelines and Blue Ocean UI
by Sreejith Sreenivasan and Vikas Koujalagi, Multics Continuous Delivery (CD) has been around for while now. However, the adoption of CD by LabVIEW and TestStand developers has been slow for many different reasons. This presentation aims to lower the barrier to entry using using declarative pipelines & the new Blue Ocean UI for Jenkins. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External Speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition |
Test/RF Hands-on Track10.45 - 12.15 | Hands-on: Prototyping Real-Time Wireless Systems with LabVIEW Communications Discover how you can use LabVIEW system design software to easily design, prototype, and deploy a wireless communications system with the USRP RIO software defined radio (SDR) platform. Build a simple spectrum analyzer, demodulate over-the-air broadcast FM radio, and explore a wireless digital communication system using this flexible SDR platform that scales from education to research applications. | 12.15 - 13.45 | Hands-on: Build an Automated Test System with LabVIEW NXG and PXI This free hands-on seminar provides an introduction to developing automated test systems using LabVIEW NXG, TestStand, and PXI, a PC-based modular instrumentation platform. During this hands-on seminar, you will get hands-on experience using LabVIEW NXG to interact with PXI instrumentation and perform automated functional tests on a real device-under-test (DUT). You will also learn about other tools for automated test, including TestStand, for test sequencing and management, and SystemLink, for test system deployment and maintenance. | 13.45 - 14.30 | Afternoon Keynote by National Instruments & External Speaker Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Hands-on: NXG 2.0 Test Drive This hands-on workshop provides an introduction to LabVIEW NXG 2.0. Come get your hands on the new features that simplify development through the hardware discovery/management, creating a web client application and much more as well as the updated features that improve productivity such as building and sharing an application. | 15.45 - 16.30 | Hands-on: NXG 2.0 Test Drive This hands-on workshop provides an introduction to LabVIEW NXG 2.0. Come get your hands on the new features that simplify development through the hardware discovery/management, creating a web client application and much more as well as the updated features that improve productivity such as building and sharing an application. |
Software and DAQ Hands-on Track10.45 - 12.15 | Hands-On: Introduction to Data Acquisition with LabVIEW NXG Even in a world full of immersive media, there is still no better way to learn new concepts than the hands-on experience. This session, geared toward new DAQ users and those wanting to evaluate the LabVIEW environment, explores how to program a measurement system to meet application-specific needs. Discover how to connect and acquire signals, perform inline analysis and file I/O, and build a rich user interface. Also get answers to your questions from NI engineers at the session. | 12.15 - 13.45 | Hands-On: Introduction to Data Acquisition with LabVIEW NXG Even in a world full of immersive media, there is still no better way to learn new concepts than the hands-on experience. This session, geared toward new DAQ users and those wanting to evaluate the LabVIEW environment, explores how to program a measurement system to meet application-specific needs. Discover how to connect and acquire signals, perform inline analysis and file I/O, and build a rich user interface. Also get answers to your questions from NI engineers at the session. | 13.45 - 14.30 | Afternoon Keynote by National Instruments Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition | 15.00 - 15.45 | Hands-on: Big Analog Data Management with DIAdem With the rise of Big Data, turning information into insight can be a formidable challenge when you’re not equipped with the right tools. Information is often contained in multiple files, saved in a variety of formats, and in more than one location. Insight is gained through mining files for the relevant data, manual analysis and creating custom, management-ready reports. In this hands-on workshop, discover how NI DIAdem can remove your Big Data problem and make data analysis simple by easily finding your data files and automating your analysis and report generation. Bring your own data along and give it a go! |
Embedded Systems Hands-on Track 10.45 - 12.15 | Hands-on: CompactRIO - Programming with LabVIEW Real-Time Learn how to quickly build and deploy embedded monitoring and control applications using CompactRIO and the LabVIEW Real-Time Module. Also, explore LabVIEW Real-Time features that increase flexibility and integration with the FPGA when programming with the RIO Scan Interface. | 12.15 - 13.45 | Hands-on: CompactRIO - Programming with LabVIEW with FPGA Take advantage of the power of reconfigurable FPGAs for custom timing/triggering, inline signal processing and fast closed-loop control. In this hands-on session, explore the basics of customising CompactRIO with LabVIEW FPGA Module programming. Attendees should have basic LabVIEW and LabVIEW Real-Time knowledge. | 13.45 - 14.30 | Afternoon Keynote by National Instruments Please see Afternoon Keynote description | 14.30 - 15.00 | Refreshments & Exhibition |
Certification Track (pre registration required)13.45 - 14.30 | Afternoon Keynote by National Instruments Please see Afternoon Keynote description | 14.30 - 15.45 | Certified LabVIEW Associate Developer Exam - Registration for this exam is now closed - please contact northern.europe.training@ni.com with any queries The NI Certified LabVIEW Associate Developer is the first step in the three-part LabVIEW certification process. It indicates a broad working knowledge of the LabVIEW environment, a basic understanding of coding and documentation best practices, and the ability to read and interpret existing code. You can use this certification to assess and validate an individual’s LabVIEW development skills for the purpose of project staffing or career advancement. Register here | 15.45 - 17.00 | The NI Certified LabVIEW Associate Developer is the first step in the three-part LabVIEW certification process. It indicates a broad working knowledge of the LabVIEW environment, a basic understanding of coding and documentation best practices, and the ability to read and interpret existing code. You can use this certification to assess and validate an individual’s LabVIEW development skills for the purpose of project staffing or career advancement. |
Meet The NI Engineer - Drop in sessions Drop in sessions | These informal drop in sessions provide you with the opportunity to sit down with a qualified engineer to discuss your current or upcoming application. Get advice on hardware choices, framework decisions, integration, migration or anything you would like guidance on. Our engineers are there to help you. Please visit the Meet the NI Engineer Stand on the event day and feel free to bring your code with you! |
NIDays provides an excellent business and networking opportunity. Look at our speakers and exhibitors to get started and look for the experts relevant to you and your applications. At NIDays you can make many meaningful connections and have productive discussions with specialists and peers. During the breaks, lunch, hands-on sessions, exhibition and at the end of day networking drink reception there is more than enough opportunity to find the right people to talk to.
When you leave the conference, you’ll have a list of people with whom you can continue building strong business relationships.
* Agenda is subject to change
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