Technology Roadmap for NI DAQ Hardware and Software | NI is a world leader in Data Acquisition and Measurement Systems. Take a glimpse into the future roadmap of NI DAQ Hardware & Software and have a look at the investment we are making in making our customers reach to their first measurement and gather analytical insights faster from their data. |
Understanding Data Acquisition System Accuracy | Learn how to understand and calculate your DAQ accuracy using NI or third-party hardware by factoring in absolute accuracy of the hardware, gain error, offset error, INL error, noise uncertainty, and calibration considerations. With live demos, try and understand some basic tips and tricks for improving measurement system accuracy. |
Practical Considerations for Connecting LabVIEW to Industrial IoT Platforms | For many LabVIEW developers and engineers without specific IT background the question remains how to connect their devices and applications to the IIoT and the associated cloud tools, (like Amazon Web Services, PTC Thingworx, IBM Bluemix and more). We'll cover some of the concepts and IIoT protocols and show how you can program your embedded system to connect to these cloud applications. |
Considerations for building an Automated Visual Inspection Systems | Are you working on building automated inspection systems? Do you want to learn about Image processing using NI tools? If yes, then this is your opportunity. This session will have speakers with years of image processing application experience and will take you through the best practices of how you can leverage NI tools for automated visual inspection systems |
Simplify System Design: Integrating Vision, Motion, Sensors, Signal Processing, HMIs, Datalogging and Analytics on the CompactRIO | CompactRIO has capabilities to run control and automation algorithm with very easy interface with I/Os (Sensors and Signals) and HMIs. It further provides capability to control multiple axis motion, aquire and process images from cameras, run parallel control and signal processing loops, control and communicate to third party PLCs over OPC and much more. This session tells you how you can easily develop systems with some of these capabilities. |
Introducing NI ATE Core Configurations and System Components | Learn about the new NI ATE System Components including 19 in. racks, power distribution units, and other common ATE hardware. Also explore the new ATE Core Configurations that integrate an ATE rack's core mechanical, power, and safety infrastructure to streamline design and reduce lead times. Use the online configurator to customize your system. |
Accelerating Semiconductor Functional Tests with NI Source Measurement Units and Digital Pattern Instruments | Two critical vectors of semiconductor test are DC power behavior and digital bus and protocol function. SMUs are incredibly versatile DC instruments that you can reconfigure for high-precision or high-speed measurements. Digital test capability can be difficult to provide with ATEs throughout the test process. See how versatile PXI SMUs and ATE-class PXI Digital Pattern Instruments are bringing characterization, validation, and production test capability to the PXI platform. |
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What's New in LabVIEW? Everything | The LabVIEW you know is changing. Explore new technologies that will fundamentally improve how you engineer your systems while receiving updates on the same LabVIEW that you know and love today. Learn what these innovations mean for you and how you can take advantage of them. |
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The Future of Web Application Development in LabVIEW | As test, measurement, control, and monitoring applications become more distributed, engineers and scientists must scale their applications to the web. Through demos and discussion, explore the future of web application development using NI tools and technology. |
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Best Practices for Life Cycle Management | When your systems are expected to operate for many years, you may have concerns about your ability to effectively repair, calibrate, or make additional purchases far into the future. Whether you take a reactive or proactive approach, this session can help you learn how to address life-cycle concerns. |
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The Evolution of ADAS - Testing Systems that Include Cameras, Radar, and Sensor Fusion | On their own, test requirements for camera and radar technology are rapidly changing as they become more safety critical. And because these systems increasingly rely on sensor fusion techniques, the test requirements are growing even more complex at a fast rate. A test system built on a scalable and flexible architecture is the only way to make sure you can adapt as quickly as ADAS technologies and autonomous vehicle systems are. In this session, we will discuss test methodologies for addressing these requirements, such as scene generation, synchronization between camera and radar simulation, and video bit stream manipulation, to truly put cameras to the test. |
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Accelerating Semiconductor Functional Tests with NI Source Measurement Units and Digital Pattern Instruments | Two critical vectors of semiconductor test are DC power behavior and digital bus and protocol function. SMUs are incredibly versatile DC instruments that you can reconfigure for high-precision or high-speed measurements. Digital test capability can be difficult to provide with ATEs throughout the test process. See how versatile PXI SMUs and ATE-class PXI Digital Pattern Instruments are bringing characterization, validation, and production test capability to the PXI platform. |
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Addressing the challenges of Vehicle Infotainment & Wireless Standards Test | Modern day in-vehicle infotainment systems are growing more and more complex with a lot of wireless standards being incorporated into a single system. Learn how you can use the new NI Vector Signal Transceiver along with LabVIEW using the RFmx APIs to generate and anslyze signals for cellular and connectivity standards like AM, FM/RDS, Navigation, Digital Audio and Video Broadcast Signals, etc. |
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An Open and Modular Platform for future Proof Hardware in the Loop Test Systems | Address the challenges of a Hardware-In-The-Loop Test System using the wide variety of I/Os on the PXI and switch, load and signal conditioning platform alongwith the open VeriStand Software framework for integrating models for Closed Loop Real Time Test. |
Addressing the challenges of Test in Aerospace & Defence Applications | Aerospace and Defense applications include prototyping and testing of EW Systems, SIGINT Systems, RADARs and much more. Having a single platform which gives you the capability of developing all these systems is really the smart approach. See how this platform can be used for developing systems like Record & Playback, RADAR Echo Simulator, Spectrum Monitoring, etc. |
Achieving Superior EVM and RF Performance | To keep up with ever-increasing consumer demands, RF engineers continue to push the limits of what they believe is possible. Examine concepts and techniques to diagnose and improve RF system performance. Also review a case study on achieving -50 dB EVM with the second-generation Vector Signal Transceiver in the new 802.11ax standard. |
Near Field Communication(NFC) and Wireless Charging testing in R&D and Manufacturing environments | |