Keynote & Arrival08.00 - 09.00 | Registration & Exhibition | 09.00 - 10.15 | Future Faster: Tomorrow's Technologies Made Possible Today Shelley Gretlein, National Instruments, Armando Arenai, Nato Support, Gunny Dhadyalla, Warwick Manufacturing Group, Golsa Hafezi, TU Wien, Sean Moynagh, Tessolve, The future, with its challenges and high expectations, can be overwhelming. But through innovation, we can meet tomorrow’s challenges today. Learn how to develop amazing, future technologies using software-defined systems that handle complex and rapidly changing requirements. See how industries such as automotive, aerospace and defence and semiconductor are shaping their future solutions for autonomy and electrification, and discover how you can apply these solutions to meet the demands of an ever-changing world. Shelley Gretlein Vice President, Corporate Marketing As vice president of corporate marketing, Shelley Gretlein is responsible for inspiring and retaining successful engineers and scientists through promoting the benefits of the NI software-defined platform. After starting at NI as an applications engineer, Gretlein spent nearly 15 years leading the development, product management, and product marketing of the NI software platform and is now looking forward to evangelizing those software benefits to engineers around the globe.. Gretlein is involved in industry consortia on robotics and industrial control, test leadership forums, embedded advisory boards, and Internet of Things technology. She has a passion for empowering future engineers, and is active in Girlstart, FIRST Robotics, and other STEM-related groups. Gretlein is also an active board member for Austin Police Operation Blue Santa, which helps more than 25,000 families in the Austin community. She holds a dual bachelor's degree in computer science and engineering management with minors in French and mathematics from Missouri University of Science and Technology. She also holds several Executive Education certifications from L'Université de Lyon; The University of Texas; the University of California, Berkeley; and the Kellogg School of Management. | 10.15 - 10.45 | Introduction to Industry Tracks | 10.45 - 11.05 | Refreshments & Exhibition |
Academia and Industry Innovation10.15 - 10.45 | Introduction to the Academia and Industry Innovation Track: Academia and Industry: Advancing Technology Together Dr Charlotte Nicolaou, National Instruments There are many challenges facing society today. Technology will play a pivotal role but to solve these problems, scientists and engineers from academia and industry need to work closer together than ever before. We’ll take a look at the obstacles facing this collaboration and see how some universities are overcoming them. We’ll also review the day’s agenda of academic and industry sessions so you can get the most out of your day. | 10.45 - 11.05 | Refreshments & Exhibition | 11.05 - 11.50 | Whats New From NI for Academia? Dr Charlotte Nicolaou, National Instruments In this session we'll take a quick look at what's new from NI to help you with your teaching and research applications. We'll look at the newest software added to the Academic Site License as well as hardware for measurement and embedded control. | 11.50 - 12.35 | Student Showcase: How Projects Can Enhance Graduate Skills Finalists from the NI Student Design Competition The NI Student Design Competition honours the best student projects from across Europe that utilise NI tools. We'll be inviting some of this year's incredible finalists and project supervisors to share their extraordinary applications. They will explain how the skills they learnt during their work have prepared them for their graduate roles, highlighting the benefits of project-based learning for students. | 12.35 - 13.25 | Lunch & Exhibition | 13.25 - 14.10 | Bridging the Hardware-Software Divide for Postgraduate Researchers Dr Gordon Flockhart, University of Strathclyde In 2013 the UK government invested £500 million through EPSRC in 115 Centres for Doctoral Training (CDT). A key element of these CDTs is the increase in formal taught course work to enhance technical interdisciplinary knowledge and broaden the postgraduate student’s skills and knowledge. This presentation discusses a new taught programme providing fundamental knowledge in analogue electronics and the latest programmable digital hardware for our CDT in Applied Photonics. This session will give an overview of the new course and look at how students applied and built on their knowledge during industry placements where they carried out their research. | 14.10 - 14.55 | Bridging the Valley of Death: Helping the UK Manufacturing Industry and University Research Work Together Morgan Williams, The Manufacturing Technology Centre We will discuss how the High Value Manufacturing Catapult is providing an environment for research establishments and industry to carry out applied R&D to benefit UK manufacturing. We'll cover the structure of the centres, our capabilities, the funding routes we use and more. | 14.55 - 15.15 | Refreshments & Exhibition | 15.15 - 16.00 | Top Tips for Delivering a Successful Research Project: An Industry Perspective Matt Collett and John Porter, Austin Consultants Although academic institutions go out of there way to nurture a professional industry-ready environment there are differences in both commercial and practical terms between Industry and Research. Based on experience gained collaborating on many research projects Austin Consultants will offer a few tips and guidance on areas that can improve successful project outcomes. | 16.00 - 16.45 | Panel Discussion: Industry & Academia Collaboration Challenges Whether producing autonomous cars, renewable energy, or consumer electronics, research and industry are pushing the bounds of technology and by working together they can accelerate their progress. Attend this panel session to learn how you can incorporate elements of academia or industry in your research. |
Aerospace and Defence10.15 - 10.45 | Introduction to the Aerospace and Defence Track: A 40-Year Aerospace and Defence Test Veteran Remco Krul, National Instruments Over the last 40 years, NI has worked with thousands of aerospace and defense engineering teams to implement better test systems and processes to reduce the risk and long-term cost of test programs. | 10.45 - 11.05 | Refreshments & Exhibition | 11.05 - 11.50 | Methodologies for Testing Modern Electronic and Electrical Aerospace Systems Jeremy Twaits, National Instruments As electronic aerospace and defence systems continue to evolve, verifying true performance in a dynamic environment is a significant challenge, and traditional test methodologies will not suffice. We will map the most current radar and electronic warfare challenges to the vendor-agnostic state of the test and measurement industry and suggest potential areas where a test or design engineer should reconsider test approaches. | 11.50 - 12.35 | Testing Earlier in the Life Cycle: Bridging the Gap Between Test and HIL Colin Freeman, Frazer-Nash Consultancy | 12.35 - 13.25 | Lunch & Exhibition | 13.25- 14.10 | Hardware-in-the-Loop Testing of Aerospace LRUs Mattias Engström, Syncore Technologies & Anders Tunströmer, Saab Robust integration and simulation environments are very important in challenging aerospace applications – from large-scale aircraft system-level simulation to individual LRU testing throughout the component lifecycle. This presentation will discuss the emerging benefits of decreasing time, cost and risk with NI’s SLSC platform, and also opportunities to use partners to optimize your work flow. | 14.10 - 14.55 | Designing and Deploying SIGINT and Electronic Warfare Systems Henrik Ulfhielm and Lars Hedlund, Novator Solutions Modern RF receivers and digitizers can acquire wider bands of data with higher quality. With the help of FPGA-based channelizers, thousands of signals can be extracted from the band for classification and demodulation. This presentation explores the benefit of modular platforms, namely PXI and USRP, for SIGINT applications, and will include an example of channelization in a COMINT application. | 14.55 - 15.15 | Refreshments & Exhibition | 15.15- 16.00 | Challenges in Standardisation, Maintenance and Through-Life Support Erwan Lhermitte and Chris Gorringe, Spherea UK Nobody expects their test systems to outlive their engineering team, but it happens. Controllers go obsolete; instruments fail and can’t be replaced or repaired; software stops working after security patches or updates; development environments become unsupportable and won’t run; test information and knowledge are lost or misplaced; configurations change and no-longer run correctly. Every programme is different, but the one constant is you never intended or expected to end up where you are now. This session will focus on solutions and processes for mitigating the impact of legacy obsolescence and aging systems. | 16.00 - 16.45 | Panel Discussion (Joint with Automotive Track in Cripplegate Room) Differing Industries, Common Challenges - What Can Aerospace and Automotive Learn from Each Other? John Birch, HORIBA MIRA Ltd, Frank Heidemann, SET GmbH, Richard Cherry, BAE Systems – Air |
Automotive10.15 - 10.45 | Introduction to the Automotive Track: The Automotive Industry Isn't Changing. It Already Has Daniel Riechbauch, National Instruments & Guest Presenter The automotive industry is no longer singularly focused on building cars. Now, engineers are leveraging the latest trends in electrification, V2X, and ADAS to provide mobility services that make it easier for both humans and goods to travel. Come hear from industry leaders to see how we can work together to build and test the vehicles of the future. | 10.45 - 11.05 | Refreshments & Exhibition | 11.05- 11.50 | Developing an Assurance Case Argument for Highly Automated Vehicles John Birch, HORIBA MIRA Ltd. There is no single standard that adequately addresses the risk associated with using highly automated vehicles, therefore there is a need for the developers of such vehicles to provide an argument for why they believe their vehicles are acceptably safe. MISRA is developing a set of guidelines for the development of automotive safety case arguments. The purpose of this talk is to propose the application of the principles of these guidelines to arguing for the safety of highly automated vehicles | 11.50 - 12.35 | How Do You Test an Electric Vehicle? Chris Garratt, Austin Consultants Electric Vehicles are rapidly approaching the main stream, but the standards surrounding electric vechicles are still in flux, and will likely continue to change going forward. How do you design a test platform which can adapt with these new requirements? In this session we will look at the current trends in EV development, and how to design a future-proof test system. | 12.35 - 13.25 | Lunch & Exhibition | 13.25- 14.10 | Testing Automated Driving Functions Using a Flexible XIL Approach Anirudda Reddy, IPG Automotive Developing automated driving functions is very demanding on the test environment. The reusability of different test cases is particularly important. At this session, learn how you can generate and use appropriate test cases throughout the development process, from model-in-the-loop and software-in-the-loop test to hardware-in-the-loop and vehicle-in-the-loop test. | 14.10 - 14.55 | Development of a Chassis HIL and Driving Simulator Integration at Volvo Cars based on a Multi-Vendor Approach Simon Schoutissen, Volvo Cars The automotive industry is in transformation! We clearly need to adapt to the fast changing technology, customer trends and increasing SW complexity by more efficient vehicle development and verification. Simulation can be seen as one of the important enablers. This session deals about the challenges of modern HIL/DIl testing, the development of a chassis HIL environment and driving simulator integration to support highly automated and exploratory testing. | 14.55 - 15.15 | Refreshments & Exhibition | 15.15 - 16.00 | Open Hardware-in-the-Loop Platforms Frank Heidemann and Robin Irwin, SET GmbH / Konrad / ADAS iiT The rapid development of new electronic systems in the automotive industry requires rapidly available HiL testing environments at a very early stage of a project. In this talk, we will have a look at an open HiL platform with a highly standardized architechture, that allows to respond to short-term specification changes and ensures early availability in the development process – within just a few weeks. | 16.00 - 16.45 | Panel Discussion (Joint with Automotive Track in Cripplegate Room) Differing Industries, Common Challenges - What Can Aerospace and Automotive Learn from Each Other? John Birch, HORIBA MIRA Ltd, Frank Heidemann, SET GmbH, Richard Cherry, BAE Systems – Air |
Semiconductor10.15 - 10.45 | Introduction to the Semiconductor Track: Lowering the Cost of Test While Improving Time-To-Market With a Platform-based Approach Joris Donders, National Instruments With increasing IC integration, industry consolidation, and global competition, engineers in the semiconductor industry face significant development cost and time-to-market pressure. Unfortunately, the historical approach of using traditional instruments in labs and ATE systems in production simply does not scale to the demands of smart devices. This disconnected approach itself is becoming a business risk to meet both cost and time-to-market demands. In this presentation, we will explain how a platform-based approach can scale to the test speed and performance needs of device validation and to the cost and reliability needs of manufacturing. | 10.45 - 11.05 | Refreshments & Exhibition | 11.05 - 11.50 | InstrumentStudio™ Software for Interactive PXI Measurements George Tsalavoutis, National Instruments InstrumentStudio software simplifies both the development and debugging of automated test systems. You can view data on unified displays with large, high-resolution monitors and then capture multi-instrument screenshots and measurement results. Save project-level configurations for easier test repeatability with specific devices under test, or export instrument configurations to programming environments to simplify your code and guarantee measurement correlation. You can also use InstrumentStudio in parallel with your code to monitor and debug running test applications. InstrumentStudio is free software that you can install automatically with driver versions 18.1 and later or manually from Package Manager. | 11.50 - 12.35 | ATE-Class PXI Digital Instruments - Smarter Digital Validation Test George Tsalavoutis, National Instruments Digital bus and protocol test is often a luxury in the R&D validation lab because it frequently requires expensive ATE equipment or highly customized digital interface boards. In this presentation, learn about a modular approach to digital test using PXI instruments. By adopting a modular approach, you can replace much of the digital capability of semiconductor ATE systems with technology featuring a footprint more appropriate for the lab. And by using ATE-grade digital instruments earlier in the design flow, you can improve the workflow of products from design validation/characterization to production test. Get a closer glimpse of how you can use NI software and hardware to execute digital pattern test earlier in the product design flow. | 12.35 - 13.25 | Lunch & Exhibition | 13.25 - 14.10 | Improving the Semiconductor Design-to-Test Flow George Zafiropoulos, National Instruments AWR Group & Cadence Design Systems Semiconductor development is a complex process. Today's design and test technology tends to focus on solving point problems. As integrated circuits and modules become more complex with a growing mix and analog, digital, RF and software, new techniques and methods must be developed to improve the overall design to test flow.In this session you will hear how NI is working with leading semiconductor companies and partners to tackle these new challenges. | 14.10 - 14.55 | Increasing Efficiency in Semiconductor Post-Silicon Validation Engineering Ganesh Devaraj, Soliton Technologies As the semiconductor industry moves towards shortened developed cycles with higher levels of complexity & integration, reusable tools to mix and match IP are becoming standard in the design and verification processes. However, the tools used in post-silicon validation are not standardizing at the same rate, at least not industry-wide. Drawing on our experience of enabling bench software standardization within multiple semiconductor companies, Soliton describes a broad set of design principles and practices that has led to success in this endeavour. We will describe the paths that an organization could take to help drive their adoption using a framework that allows users to iteratively enhance it to service multiple product teams. We will also highlight how standardization in the lab is an important enabler for lab to production leverage. | 14.55 - 15.15 | Refreshments & Exhibition | 15.15 - 16.00 | Words of Wisdom: Lessons Learned From NI STS Deployments Sean Moynagh, Tessolve With 1400+ employees, Tessolve enables customers a faster time-to-market by offering expertise in the areas of Semiconductor and Systems Design, Test & Product Engineering, HW development, and manufacturing supply chain under one roof. Tessolve is here to share the Words of Wisdom, Lessons Learned. | 16.00 - 16.45 | Insight into NI's Semiconductor Roadmap Priorities Joris Donders, National Instruments National instruments is continously investing to expand our Semiconductor Test offering, As a company we want our customers to benefit from our strategic investments. We will recap and discuss recent releases and take a glimpse into the future |
Building an Automated Test System 10.15 - 10.45 | Introduction to the How to Build an Automated Test System & How-to Build an Automated Measurement System Tracks: Whats New in LabVIEW 2018 and LabVIEW NXG Kelly Chan, National Instruments There is a lot of overlap in the tools used in test and measurement systems. In this joint track keynote session we'll give a brief update on some of the latest software and hardware that can be used for both application areas such as LabVIEW NXG, Instrument Studio and the 9040x cRIO series. | 10.45 - 11.05 | Refreshments & Exhibition | 11.05 - 11.50 | What Makes a Good Test Software Framework? Phil Rawlings, Simplicity AI The use of a test software framework can help organisations streamline the development process and improve the supportability of test solutions through-life. This session will detail key considerations when designing a framework and offer practical advice to best realise the benefits. Additionally, real examples of deployed frameworks will be discussed to highlight the possibilities as well as the challenges that may be encountered along the way. | 11.50 - 12.35 | Importance of Abstraction & Standardisation in Automated Test Systems Jonathan Hobson, TBG Solutions The need for dynamic, scalable and reconfigurable test equipment is becoming more and more prevalent in a range of industries and applications from production test to R&D, to fulfil these everchanging requirements a strong foundation of abstraction and standardisation is required. In this session we will explore a range of abstraction techniques including hardware and measurement abstraction as well as the benefits of providing a standardised platform across multiple ATEs. | 12.35 - 13.25 | Lunch & Exhibition | 13.25 - 14.10 | Development Process of a Test System Ben Carruthers-Watt, Renishaw A case study looking at the development process of bespoke test system for a low-volume component and the role of the Process Development Engineer. The test system must combine test requirements from the product, usability requirements from an operator and reporting requirements from Production Engineers and end-users to create a robust system, ensuring each part meets the quality standards demanded by the customer. The role of the Process Development Engineer is to combine these requirements, working with Mechanical Engineers, Electronics Engineers, Production Engineers and Operators to deliver the overall test system. | 14.10 - 14.55 | Power and Thermal Best Practices in Racked Test Systems Chris Jones, National Instruments Defining a test strategy is critical to reducing cost and maximizing the efficiency of your product development and manufacturing organizations. Ensure you have the fundamentals to build a smarter test system that can address your needs today and in the future with test engineer best practices for power budgeting and thermal profiling. | 14.55 - 15.15 | Refreshments & Exhibition | 15.15 - 16.00 | Boost Operational Efficiency With Distributed Systems Management Andreas Palmstrøm, National Instruments It can be challenging to connect to, deploy to and amanged distributed automated test and measurement systems, often require hours of manual work just to update software. At this session, we'll showcase SystemLink™, a new NI tool to centralise the management of software deployments, system configuration, health and performance management, and test monitoring. | 16.00 - 16.45 | How to Collect and Analyse Test Data From Remote ATEs? Tero Leppänen, Etteplan Collecting and analyzing test data efficiently and in real-time is often a challenge in the manufacturing of electronics products. In this presentation we’ll show a real-life case study on how an existing ATE fleet can be connected to common SPC analytics tool with minimum effort by utilizing NI TestStand and skyWATS products. The presentaion demonstrates also the benefits of the test data analytics and standardization in testing. |
Developing an Automated Measurement System10.15 - 10.45 | Introduction to the How to Build an Automated Test System & How-to Build an Automated Measurement System Tracks: Whats New in LabVIEW 2018 and LabVIEW NXG Kelly Chan, National Instruments There is a lot of overlap in the tools used in test and measurement systems. In this joint track keynote session we'll give a brief update on some of the latest software and hardware that can be used for both application areas such as LabVIEW NXG, Instrument Studio and the 9040x cRIO series. | 10.45 - 11.05 | Refreshments & Exhibition | 11.05 - 11.50 | Speed Up Software Development: The Increasing Power of Malleable VIs Ashley Nunn, National Instruments LabVIEW 2017 incorporated malleable VIs to help you write VIs once and reuse them with any compatible data type while avoiding the performance hit of variants or the complexity of class abstractions. In 2018, these VIs gain more power. Learn to write VIs that are as type-flexible as built-in LabVIEW functions. G developers from novice to adept welcome! | 11.50 - 12.35 | Future Proof Your Code with Object Oriented Programming Tom McQuillan, Scientifica For maximum efficiency every software developer should aim to make their code scalable, maintainable and reusable. In this presentation, I will take you through the techniques I use to achieve this. We will go through the concepts of Object Oriented Programming (OOP) and its practical implementation via a live demonstration that refactors a well-known sample project that comes with LabVIEW. I will also guide you through the design process to create a project from scratch and show how our design can be implemented in G (the language we use in LabVIEW).
This session is best suited for LabVIEW developers and those wishing to broaden their programming knowledge. | 12.35 - 13.25 | Lunch & Exhibition | 13.25 - 14.10 | Integrating Other Hardware with an NI DAQ System James McNally, Wiresmith Technology NI hardware gives a broad choice but sometimes it wont do. Perhaps you have legacy systems or need some specialised or different measurements like images. This presentation will talk about the key design decisions you need to cover when integrating this hardware. | 14.10 - 14.55 | Choosing the Best Tool for Datalogging and Physical Systems Test Andreas Jost, National Instruments We'll discuss different ways to acquire and log mixed signals, customise visualisation and integrate third-party device when testing physical systems. We'll compare LabVIEW with FlexLogger, NI's latest datalogging tool, to see when a custom system like LabVIEW should be used and when a more flexible, configuration based tool is more efficient. | 14.55 - 15.15 | Refreshments & Exhibition | 15.15 - 16.00 | Best Practices for Interfacing NI Products with MathWorks ® Software Dr Jeannie Falcon, National Instruments Explore best practices for interfacing MathWorks software to NI hardware and software for the development of test, measurement, and control systems. This includes direct interfaces to NI hardware and interfaces between MathWorks computing and design software and NI programming environments and application software. | 16.00 - 16.45 | Why I Cringe When Everyone Wants Data in Excel James McNally, Wiresmith Technology It is often the same request:"We need the data in a csv file to work in Excel". This is a perfectly valid request and we often support it but there are limitations to this approach.This presentation will discuss: CSV vs TDMS for performance and meta-data. and alternative tools like DIAdem for mining and interactive inspection. |
NIDays provides an excellent business and networking opportunity. Look at our speakers and exhibitors to get started and look for the experts relevant to you and your applications. At NIDays you can make many meaningful connections and have productive discussions with specialists and peers. During the breaks, lunch, hands-on sessions, exhibition and at the end of day networking drink reception there is more than enough opportunity to find the right people to talk to.
When you leave the conference, you’ll have a list of people with whom you can continue building strong business relationships.
*Agenda is subject to change
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