Aerospace and Defense TrackNew Hire Onboarding and Engineering Skills Development | Erik Wolf, Director of Test at Harris Corporation The systems we build are increasing in complexity, and our customers are demanding shorter schedules to test and deliver those systems. To meet these needs, we need to develop highly-skilled engineers that can contribute to our test plans, software, and architectures as quickly as possible. In this session, Harris Space and Intelligence Systems will share some of the practices we have put in place for onboarding and continuous training of our test engineers. Monday, May 20 | 10:15AM-11:15AM | Ballroom A Aerospace and Defense Forum Each forum serves as a unique networking opportunity where attendees can discuss trends and industry-specific topics with their peers and the NI team. Monday, May 20 | 1:15PM-2:00PM | Ballroom A Baking in Cybersecurity and Risk Management Framework for U.S. Navy Test Equipment | Christopher H. Clark, Chemical Engineer at Naval Surface Warfare Center, Corona Division | Jeffery G. Benson, System Engineer / Physicist at Naval Surface Warfare Center, Corona Division | Gary G. Yeakley, System Engineer / Physicist at Naval Surface Warfare Center, Corona Division | Terrence Bedford, Information System Security Officer (ISSO) at Naval Surface Warfare Center, Corona Division The U.S. DoD and its contractors are required to follow NIST Special Publications 800-37 and 800-53 which lay out the cybersecurity Risk Management Framework (RMF). Unlike previous DoD policy, RMF is continuous and applies to not only classic information technology (IT), but operational technology as well including controllers, test equipment, automated test stations, and other equipment. The NSWC, Corona team will share their methodologies, best practices, and lesson learned in designing and building, to the letter and intent of RMF, a prototype test station for a subset of required U.S. Navy tests. Monday, May 20 | 4:45PM-5:45PM | Ballroom B Managing Factory Test Content under a Risk Management Framework | Randal Bailey, Engineering Fellow and Chief Engineer at BAE Systems To meet customer needs while remaining competitive electronics industries are challenged to reduce costs, compress design schedules, and provide robust products. These forces often drive non-optimal test solutions into production use. In this session, BAE Systems will highlight common obstacles to leaner testing and describe a managerial approach for the optimization of “Test Content”. This approach is focused on the establishment of minimal and sufficient “Core Testing” at the beginning of the product development process and then adding “Supplemental Testing” that is recurring, yet temporary, for the purpose of mitigating risks during early production phases. Tuesday, May 21 | 9:45AM-10:45AM | Ballroom A Automotive Test TrackCombining Hardware Emulation with Software Simulation for Greater Test Coverage | HoJin Ji, Research Engineer at Hyundai Autron | Jiwon Yoo, ADAS & Chassis system Validation Team, Research Engineer at Hyundai Autron | Jinjong Lee, Manager of Automotive HILS and ADAS at Konrad Technologies It is well understood that simulation will be needed to fully test ADAS and autonomous driving algorithms, but hardware emulation has an important role to play between software simulation and field testing. Learn how Hyundai Autron increased their test coverage with sacrificing reality by combining radar and camera hardware emulation with IPG CarMaker scene generation scenarios. Monday, May 20 | 10:15AM-11:15AM | Ballroom C Transportation Forum Each forum serves as a unique networking opportunity where attendees can discuss trends and industry-specific topics with their peers and the NI team. Monday, May 20 | 1:15PM-2:00PM | Ballroom C How Changing Electric Mobility Technology Will Impact Testing | Harsha Nanjundaswamy, Director of E-Mobility at FEV North America In contrast to ICE powertrain emissions and fuel economy challenges, BEV’s have to overcome unique design and control challenges as system optimization is targeted over performance based value proposition. Hence, the BEV engineering community is developing novel solutions to advance specific energy of batteries, performance of E-Motors and power electronics. In this presentation, we will provide an insight into ongoing trends in electrified mobility including a deep dive assessment of opportunities and challenges that are ahead of the industry. The presentation will provide broader insight into the increasingly importance of high speed and highly accurate testing, measurement and data analysis of advanced e-powertrain systems and components. Monday, May 20 | 2:15PM-3:15PM | Ballroom B Panel Discussion: The Best Way to Test ADAS and AD Systems | Celite Milbrandt, Founder and CEO at Monodrive | Paul Borbely, Tools Development Manager at Valeo | Dr. Thomas Herpel, Manager of Test System Development at Zukunft Mobility ADAS and autonomous driving systems are challenging test organizations to both quickly adapt to new technology and to vet out safety critical systems without compromising time to market. Adding to the problem is a lack of regulatory and standards guidance which means test leaders are left to invent their own methodologies to safely validate systems as efficiently as possible. Hear from a panel of industry experts about how they see the test market evolving to handle both these new technologies and the evolving safety requirements that come with them. Monday, May 20 | 4:45PM-5:45PM | Ballroom A
Lessons Learned in Test Automation | Serban Marfa, Infotainment and Connected Car Test Automation Lead at Jaguar Land Rover
Test Automation is often perceived as an activity less complex than software development. Thus, significant investments are made primarily in automation tools and high expectations are set. However, the project outcomes often do not satisfy the initial expectations and future automation initiatives are abandoned. This presentation will take you through our journey, our lessons learnt and the steps we took to avoid this common pitfall. We will highlight how collaboration with NI and Alliance Partners along with investment in people and automation development processes can help build a strong center of competence. Finally we will explore how extending collaboration can help us overcome the challenges of increasing test coverage, decreasing time to market and improving quality in a resource constrained environment. Tuesday, May 21 | 9:45AM-10:45AM | Ballroom B Optimizing Validation Testing - Balancing Time, Cost, and Quality | Gunwant Dhadyalla, Chief Engineer at University of Warwick System complexity and shorter development cycles are imposing significant challenges on test. Building validation confidence as early as possible in development is critical to avoiding costly rework and interoperability challenges later in the development V. Standardising test workflows, tools and process is one method to optimise. But how do we balance virtual, HIL and physical test approaches as part of delivering capability on time and at high confidence? What limitations exist in test technology, DUT complexity and OEM/Tier 1 collaboration in order to achieve this? This session will provide a fresh perspective on thinking through the challenge, and provide insight into the latest research exploring best in class approaches to solving the problem. Tuesday, May 21 | 11:00AM-12:00PM | Ballroom B Business and Technology Leadership TrackLessons Learned from Test Transformation Initiatives - the Good, the Bad, and the Ugly | Augusto Mandelli & Sugato Deb, NI Business Impact Group at National Instruments Only about one-third of test transformation initiatives succeed in reaching their business impact metrics. Building on the highly-rated previous TLF session “Why Test Standardizations Fail and What to Do About It”, this session widens the scope and explores the failure modes and success stories of effective test transformation initiatives. We will share how successful organizations have built organizational consensus on the Why, What, and How to transform including securing executive sponsorship and upfront investment, and how have they measured their impact on globalization, flexibility and productivity. Monday, May 20 | 2:15PM-3:15pm | Ballroom C The Challenges of Test Investments in an Environment of Competing Needs | Rob Porterfield, VP Manufacturing and Supply Chain at National Instruments Rob will provide an executive’s point of view on investing forward in a test strategy with limited capital and resource availability while product complexity increases and time to market reduces. He will discuss understanding true costs using a total cost of ownership (TCO) perspective, determining risks versus rewards tradeoffs, developing organizational sponsorship at the executive level and setting a multi-year vision of change with clear business outcomes. As a case study, he will analyze National Instruments’ test transformation over three decades and highlight learning and best practices that can be applied by test leaders. Monday, May 20 | 3:30PM-4:30PM | Ballrooms A, B, C How to Build and Sustain Consensus for Change across your Organization Silos | Robert Lee & Chad Ruwe, NI Business Impact Group at National Instruments As the number of stakeholder departments and perspectives increases (Gartner/CEB study lists an average of 6.8 stakeholders involved, 3.7 customer functions represented), test leaders need to learn best practices on how to build consensus internally across organizational silos. We will discuss real life case studies on how to align across the tester builder, the tester consumer/user, and the tester funder silos. Once secured, we will cover how best-in-class organizations maintain stakeholder enthusiasm, trust, and prioritization to see it through to execution. Tuesday, May 21 | 11AM-12:00PM | Ballroom A Semiconductor TrackON Semiconductor Takes A New Approach to Production Test | Warren Latter, Test Engineering Professional at ON Semiconductor ON Semiconductor, a leading chip maker, discusses their new approach to semiconductor production test at both the chip and wafer level. Learn how by partnering with NI, ON was able to meet extremely demanding schedules, and unify their global organization while reducing operational and capital expenditures. Monday, May 20 | 10:15AM-11:15AM | Ballroom B Semiconductor Forum Each forum serves as a unique networking opportunity where attendees can discuss trends and industry-specific topics with their peers and the NI team. Monday, May 20 | 1:15PM-2:00PM | Ballroom B Challenges of mmWave OTA Test | Chen Chang, Strategic Business Development Director at National Instruments As 5G becomes reality and the semiconductor industry turns its focus towards mmWave 5G, we are seeing more devices that operate above 24 GHz. Learn about the technical and business challenges of over-the-air (OTA) test of mmWave 5G devices. Monday, May 20 | 2:15PM-3:15PM | Ballroom A Successful Semiconductor Wafer Probe Test Solutions for mmWave Production | Eric Hill, VP of RF Product Group at FormFactor, Inc. Semiconductor wafer probe test includes several elements to be successful. This session will explore the requirements for the growing RF and mmWave device test applications. Topics will include performance requirement trade-offs for cost effective production, probe card design, direct dock interfacing, calibration and other setup considerations. Monday, May 20 | 4:45PM-5:45PM | Ballroom C Panel: Standardizing the Semiconductor Test Lab | Erika Beskar, Director of Validation and Test at Texas Instruments | Marc Van Laer, Group Leader of Product Engineering and V&V at NXP| Antonio Lie, Senior Test Automation Manager at pSemi, a Murata Company | Dan Kimmitt, Industry Consultant. Driving both innovation and standardization into the Semiconductor lab have several benefits which ultimately improve product quality, time to market, and better end customer results. But to pull this off requires significant investment and organizational changes to fully achieve the desired results. Join a panel of renowned semiconductor test leaders to discuss the pros and cons of driving innovation and standardization into the semiconductor lab. Tuesday, May 21 | 2:30PM-3:30PM | Room 17B Data DayMonday, May 20 | 8:30AM-5:00PM | Meeting Room 6A NI Data Day, held in conjunction with NIWeek, offers the ideal environment for engineers and managers to discuss the most efficient ways to make data-driven decisions using the growing amounts of test and measurement data collected across the organization. Data Day evangelizes the need for optimized data management, promotes collaboration across different industries, and showcases best practices from organizations that have recently implemented successful systems and data management solutions. Agenda: 8:30-10:30am | Registration | 9:00-10:00am | Keynote: Systems and Data Management | 10:15-11:15am | NI Presentation: SystemLink and Data Management Product Roadmap | 11:30am-1:00pm | Lunch & Networking | 1:15-2:15pm | GigaWatts of Data: Bringing Data Management into the 21st Century –Presented by: Endigit and Idaho National Laboratory | 2:15-3:15pm | Improving Operational Efficiency with Remote Test Cell Management - Presented by: Blue Origin | 3:30-4:30pm | How One Automotive Manufacturer Accelerated Innovation with Powerful Data Management and Analysis Software for Their Design, Prototyping, and Test Environments - Presented by: Viviota | 4:45-5:00pm | Wrap up & Exit Survey |
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