2019 Downloadable Presentations

• Lessons Learned from Test Transformation Initiatives - the Good, the Bad, and the Ugly
  Augusto Mandelli & Sugato Deb, National Instruments
• The Challenges of Test Investments in an Environment of Competing Needs
  Rob Porterfield, National Instruments
• How to Build and Sustain Consensus for Change across your Organization Silos
  Robert Lee & Chad Ruwe, National Instruments

• Challenges of mmWave OTA Test
  Chen Chang, National Instruments
• ON Semiconductor Takes A New Approach to Production Test
  Warren Latter, ON Semiconductor
• Successful Semiconductor Wafer Probe Test Solutions for mmWave Production
  Eric Hill, FormFactor, Inc.