Drive efficiency into your workflow with tools in LabVIEW 2018 that simplify system integration and accelerate productivity. LabVIEW NXG allows  to test smarter by configuring, automating, and visualizing your results, all within a single tool.  See how to use the new features in both LabVIEW versions to develop at the speed of innovation.

 

With increasing IC integration and complexity, industry consolidation, and global competition, semiconductor test engineers face significant development cost and time-to-market pressure. Unfortunately, the historical approach of using traditional instruments in the characterization lab simply does not scale to the demands of the industry. This disconnected approach itself poses the business risk of unmet cost and time-to-market demands. In this presentation, learn how a platform-based approach can scale to your test speed and performance needs for device validation. Also see firsthand how you can use this platform from DUT bring-up to full lab automation to production-scale test.

 

For 40 years, NI has worked with engineers and scientists to provide answers to the most challenging questions. Through these pursuits, NI customers have brought hundreds of thousands of products to market, overcome innumerable technological roadblocks, and engineered a better life for us all. In these sessions, we have our users to share about their stories and experience with NI.

 

Digital bus and protocol test is often a luxury in the R&D validation lab because it frequently requires expensive ATE equipment or highly customized digital interface boards. In this presentation, learn about a modular approach to digital test using PXI instruments. By adopting a modular approach, you can replace much of the digital capability of semiconductor ATE systems with technology featuring a footprint more appropriate for the lab. And by using ATE-grade digital instruments earlier in the design flow, you can improve the workflow of products from design validation/characterization to production test. Get a closer glimpse of how you can use NI software and hardware to execute digital pattern test earlier in the product design flow.

 

With the formalization of the 3GPP Release 15 specifications, engineers are increasingly developing 5G New Radio (5G NR) RFICs. With wider bandwidth than previous 4G technology, new spectrum below 6 GHz and at millimeter wave frequencies, and new waveforms, 5G NR presents unique test challenges. In this presentation, get an update on the 3GPP 5G standardization process and what has been finalized for 5G. Also learn the fundamental changes to the NR physical layer and the test challenges these changes present in your device validation and characterization applications