Visit NI at Embedded World 2019!
26 –28 February 2019, Nuremberg Exhibition Centre
Hall 4, Booth 108
A new era of mobility is upon us. Critical technology trends in autonomous driving, electrification, and vehicle communication are bringing with them new test challenges and pressures beyond the here and now. The quickly evolving technology landscape increases the pressure on already aggressive test schedules and test requirements.
At this year’s embedded world trade fair in Nuremberg you’ll see demonstrations of how NI’s open and easily upgradable platform can validate and test ADAS, EV, and V2X systems.
Visit us in Hall 4, Booth 108 and learn more about:
Meet our NI experts & Get your free visitors ticket
Get your free exhibition ticket for embedded world 2019. Use our
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Visit NI @ Embedded World Conference & Exhibition Forum
Time | Topic | Speaker | Location |
Tuesday, Feb 26:
10:00 - 10:30 am | Testing in Automotive is not changing,… it already has!
Example Case: Record & Playback of ADAS Data | Emmanuel Roset,
National Instruments | Exhibition Forum Hall 3, Booth No. 719 |
Wednesday, Feb 27: 2:00 - 2:30 pm | Overcoming the challenges of rapid change in Automotive leveraging an Open HIL platform | Daniel Clapham,
National Instruments Frank Heidemann,
SET GmbH | Exhibition Forum Hall 3, Booth No. 719 |
Meet our NI Alliance Partner at the NI booth
They know how to test! Meet some of our partners that co-exhibit on our NI booth!