– Newsflash – NIDays Europe Keynote Speaker confirmed: Mark Gallagher - Grand Prix Motor Racing Executive talking about Risk and Data Management in the F1 Industry. | Mark Gallagher has held senior roles in the high performance environment of Formula One motor racing for over 30 years. Gallagher’s management career in Formula One included more than a decade on the management board of the highly successful Jordan Grand Prix team, running the world famous Cosworth engine business and establishing the commercial arm of Red Bull Racing which went on to become 4-times World Champions. During his career he has worked with many of the sport’s leading drivers, including former World Champions Ayrton Senna, Michael Schumacher and Jenson Button. He continues to work closely with a number of the sport’s major stars including David Coulthard, Mika Hakkinen and Jacques Villeneuve. More recently Gallagher worked with the sport’s governing body, the FIA, to develop the new hybrid petrol-electric engine regulations introduced into Formula One in 2014. |
Full Force of the NI Ecosystem – Alliance Day Europe 2019* Welcome partners from across Europe, the Middle East, India and Africa to our first pan-regional Alliance Day Europe 2019. This exclusive, full-day program offers multiple opportunities to learn and network. Hear from global executives and regional leaders about NI’s vision, strategy, and business updates during the morning keynote. Throughout the day, take advantage of business fundamentals, industry, product, and skills development learning tracks delivered by NI and industry experts. Wrap up your day over cocktails with peers and colleagues as we honour recent partner successes with awards. Registration is open now*. Partners can choose from various pricing including single day, full conference, or volume discount packages. *Alliance Day is open to current Alliance Partners and Distributors only. Expand the sections below to view the preliminary agenda. PRE-CONFERENCE BUSINESS WORKSHOPS – 18 NOVEMBERIn conjunction with NIDays Europe, take advantage of a two-part workshop on “Client Creation” offering partners successful strategies for developing sales and marketing demand generation and client nurturing programs. Presented by Exotek, LLC. Effectively Market and Sell System Integration Services Monday, 18-November: 13:00-15:00 pm, NI-Munich Office Monday, 18-November: 15:30 - 17:30 pm, NI-Munich Office Monday, 18-November: 13:00-17:30 pm, NI-Munich Office Business Fundamentals 08:00 | Registration and Light Breakfast | 09:00 | Alliance Day Keynote | 10:15 | Coffee Break | 10:30 | Collaborating With NI Sales to Engage Customers Frederic Boullot and Jack Bering, National Instruments
With the specialization in customer-facing sales roles at NI, partners have new opportunities to engage with NI sellers to reach customers in their regions or target application domains. Discover how your sales team can collaborate with NI sellers to increase your pool of potential customers. | 11:15 | Succeed With Your Alliance Partner Network Services and Benefits (Program Update) Penny Wright, National Instruments Brand presence, products and technical training, and sales enablement are just some of the benefits of the Alliance Partner Network. Learn about the latest network updates and ways you can work with NI to drive your business success. | 12:00 | Project Management: Beyond 101 Jack Barber and Don Roberts, Exotek Discover how to define a customer's real priorities before starting a project; determine if the scope, budget, and schedule are on track; and write acceptance criteria that serve both the customer's and your needs. Explore real-world examples of successful projects. | 12:45 | Lunch Break | 13:45 | Streamline Your Internal Learning and Development Processes Saket Dwivedi and Roberto Isernia, National Instruments The ongoing training and development of your engineers and developers is instrumental for your long-term success in developing customer systems and solutions. Stay on top of the latest technology trends and develop your NI platform proficiency by taking advantage of the development resources and services provided by the Alliance Partner Network. | 14:30 | Keeping Score with Financial MetricsJack Barber and Don Roberts, National Instruments Technical success as an NI Alliance Partner is great, but ultimately, you need to be financially successful to run and grow a business. So, financial management is just as important as good project management. And, failure to do so is often the primary reason for the demise of a small services business. In this session, we discuss implementing adequate processes to manage, control, report, and plan your finances. | |
15:15 | Marketing 101: How to Acquire, Engage, and Retain Your Target Audience Trisha McDonell, Penny Wright, National Instruments Explore fundamental marketing strategies and tactics to acquire new contacts, retain and engage existing contacts in your database, and win back contacts. Focus on tangible behaviors you can adopt that scale from small to big businesses and examine common pitfalls in B2B marketing. | 16:00 | Afternoon Break - Open Networking, Meetings and Expo Set up Begins | 17:30 | Networking Happy Hour with Snacks and Drinks | 18:00 | Award Ceremony |
Industry & Strategy 08:00 | Registration and Light Breakfast | 09:00 | Alliance Day Keynote | 10:15 | Coffee Break | 10:30 | NI's Automotive Strategy to unlock regional Business Potential Daniel Riedelbauch, National Instruments The challenges test engineers in the automotive industry face present a unique opportunity for NI and Alliance Partners. Get a high-level overview of the trends driving change, the challenges these changes are introducing, and where and how to differentiate the NI platform in meeting those challenges. | 11:15 | NI's Aerospace, Defence, and Government Strategy Baskar Ceri, National Instruments Explore emerging market trends that NI is seeing in the industry and learn how NI is growing awareness and market share in this space. | 12:00 | Collaborating with NI to Build Lifecycle Management Services in Customer Opportunities Ezio Avalli, National Instruments Learn from recent successes where NI and partners are working together to build hardware services into customer opportunities and solutions. The session will feature case studies and show examples of how to ask the right questions, collect feedback, and build a proposal that includes this type of service for the customer. | 12:45 | Lunch Break | 13:45 | Alliance Partners and NI's Portfolio Business Unit Aditi Chauhan, National Instruments The Portfolio Business Unit (BU) provides NI's largest revenue amount and covers a wide spectrum of industries and applications. Alliance Partners are a critical part of this business. Discuss the Portfolio BU's mission, plans, offerings, structure, and staff and learn how partners can engage with this BU. | |
15:15 | Addressing Market Changes in Semiconductor Test With STSJoris Donders, National Instruments
NI is making substantial progress in helping customers leverage key investments in lab characterization to achieve shorter time to production test in high-volume manufacturing. Discover why customers are adopting the NI Semiconductor Test System (STS), hear about their successes, and learn about the role of STS Specialty partners. | 16:00 | Afternoon Break - Open Networking, Meetings and Expo Set up Begins | 17:30 | Networking Happy Hour with Snacks and Drinks | 18:00 | Award Ceremony |
Product Updates 08:00 | Registration and Light Breakfast | 09:00 | Alliance Day Keynote | 10:15 | Coffee Break | 10:30 | No session at this time | 11:15 | LabVIEW and LabVIEW NXG Roadmap Dennis Issel, National Instruments Hear about NI's future plans for LabVIEW and LabVIEW NXG in this deep dive into the development roadmap and learn how to provide feedback on specific topics. | 12:00 | Data Acquisition and Control Product Roadmap Alexander Thölke, National Instruments With hundreds of C Series modules and DAQ devices to choose from, you may have difficulty keeping up with all the latest innovations from NI. Explore the newest product releases and the future direction for NI DAQ and control products. | 12:45 | Lunch Break | 13:45 | Migrating LabVIEW Code to LabVIEW NXG Chris Roebuck, Konrad Technologies Abstract will follow soon | 14:30 | mmWave VST Introduction Mher Minasyan, National Instruments The all new mmWave Vector Signal Transceiver is launching this year at NI Week 2019. Come find out how the power of the VST platform will change the way you test at mmWave! | |
15:15 | No session at this time | 16:00 | Afternoon Break - Open Networking, Meetings and Expo Set up Begins | 17:30 | Networking Happy Hour with Snacks and Drinks | 18:00 | Award Ceremony |
DistributorsThe sessions are by invitation only. 08:00 | Registration and Light Breakfast | 09:00 | Alliance Day Keynote | 10:15 | Coffee Break | 10:30 | The Latest Distributor Program News (Distributor - Invite Only) David Baker, National Instruments
Learn about the latest developments for NI's Global Distribution Program, share feedback and gain insight into 2020 plans | 11:15 | Business Discussion & Feedback (Distributor - Invite Only) Elie Abou Nasr, National Instruments Come prepared to discuss your top 2 challenges you are facing with your current business plan execution. This Discussion based session will lead to best practice advise ready for 2020 plans | 12:00 | Business Planning (Distributor - Invite Only) Riccardo Susini, National Instruments A refresher on the need for business planning, how and when and why for regular collaboration with the NI Channel Team | 12:45 | Lunch Break | 13:45 | CEP Training Refresher (Distributor - Invite Only) David Baker, National Instruments How to sell training refresher for your sales teams following NI best pratice | 14:30 | Uncovering Opportunities Through Syllabus Fit Analysis Hands-On Exercise (Distributor - Invite Only) Nancy Dib, National Instruments Walk through exercises using portal resources to better understand an academic account and building a plan to uncover new opportunities. | 16:00 | Afternoon Break - Open Networking, Meetings and Expo Set up Begins | 17:30 | Networking Happy Hour with Snacks and Drinks | 18:00 | Award Ceremony |
Wednesday, November 20Aerospace & Defence More detailed information around Aerospace & Defence can be found here 08:30 | Registration | 09:30 | Full Force Ahead: Opening Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | Transmitter Control Unit Development with NI PXI and FlexRIO Armando Arenai, European Defence Organization
During the 12 months before the first deployment of a state-of-the-art solid-state modulator, we needed to architect, develop, and test a replacement transmitter control unit to manage the operation of the modulator’s radar transmitter. We took advantage of highly flexible, reconfigurable NI R Series and FlexRIO products and the short development cycle of LabVIEW FPGA, which offered the perfect solution to meet deadlines and provide inherent savings compared with other commercial off-the-shelf or custom products. | 12:00 | Building a PXI-Based Real-time Radar Target Simulator to Test Complex Radars from the Ground Up in Three Months Avinash Chenreddy and Satya Gopal Panigrahi, CONSTELLI Today’s complex radars demand sophisticated solutions to test their functionalities and signal-processing abilities. Learn how engineers at Constelli have developed an advanced radar target simulator with range, velocity, RCS, antenna pattern, and multitarget trajectory simulation using the NI PXI RF platform and NI LabVIEW FPGA from the ground up in three months. | 12:45 | Lunch Break | 14:15 | Modular Test Solutions Supporting Platform Integrators and EW Sensor Manufacturers Dr. Massimo Sciotti, ELETTRONICA The wide availability of high-performing commercial-off-the-shelf hardware units has paved the way for building reconfigurable, general-purpose architectures that serve multiple test and evaluation (T&E) purposes. Ranging from design support to on-site validation, including sensors verification before integration on the platform, National Instruments devices easily can be composed into complex T&E solutions to fully meet user needs related to state-of-the-art and next-generation EW, ISR, COM and NAV sensors. Simulation and real-time processing techniques, which can be integrated in the NI hardware or developed using plug-in architecture, are key. Scalability, reconfigurability, and customization are the important features of NI T&E assets. View examples and applications of evolving test requirements in EW/ISR. | 15:00 | Verification and Validation of Active Electronically Scanned Arrays for 5G, Satellites, and Defence Applications Marco Lisi, EUROPEAN COMMISSION EXPERT and Chris Behnke, NATIONAL INSTRUMENTS Active electronically scanned arrays (AESAs) are a key technology for advanced RF/microwave systems in navigation, communications, radars, and electronic warfare (EW). This presentation details broadband, multichannel, phase-coherent digital test setups, based on National Instruments technology, suitable for the development, verification, and validation of complex AESA systems. | 15:45 | Coffee Break - Exhibition | |
16:15 | EGSE and SCOE Test Systems for Satellite Integration Christian Korreng and Bernhard Altvater, LXINSTRUMENTS In this technical presentation, learn how LXinstruments developed complex, scalable test and validation systems used in electronic ground support equipment (EGSE) for satellite testing. The modular approach contains several PXI mainframes with off-the-shelf modules to cover common EGSE functions, complemented by specialized NI PXI FPGA modules and 19 in. instrumentation. The system is controlled either via remote with the OPC UA module, or locally, via the customized GUI. | 17:00 | Best Practices for Designing Rugged SDR Solutions for Field Applications Steven Romm, AVDOR The exponential technological advances we are witnessing are also responsible for an increased variety and number of threats. That’s why police, first responders, and armies need EW, jammers, antidrones, and other systems that are field capable and flexible enough to be deployed on the battlefield or around critical infrastructures. Off-the-shelf platforms can provide flexibility, but are not rugged enough for demanding environments. Learn best practices for environmental, mechanical, thermal, and signal design to fortify OTS platforms, such NI SDR, and build reliable, powerful systems that increase defence and security force capabilities. | 17:45 | Networking | 19:00 | Evening Party |
Semiconductor V&V More detailed information around Semiconductor can be found here 08:30 | Registration | 09:30 | Full Force Ahead: Opening Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | Addressing Market Changes in Semiconductor Test With STS Joris Donders, NATIONAL INSTRUMENTS
NI is making substantial progress in helping customers leverage key investments in lab characterization to achieve shorter time to production test in high-volume manufacturing. Discover why customers are adopting the NI Semiconductor Test System (STS), hear about their successes, and learn about the role of STS Specialty partners. | 12:00 | Significantly Reducing Characterization Timelines by Globally Standardizing on a Common Approach Wouter Janssens, MELEXIS In 2014, Melexis decided to drastically change our way of performing characterization by moving away from using a rack-and-stack approach. As a growing company, we needed to optimize our approach and reduce the time we spend on characterizing our products. In this session, learn how we successfully made such a significant change and what results and benefits we have seen, and how we are working to keep the standardization in place and evolve it over time. | 12:45 | Lunch Break | 14:15 | How to Succeed (and Fail) at Bridging Validation and Production Test John Bongaarts, NATIONAL INSTRUMENTS The ability to meet time-to-market targets is key for a chipmaker to be competitive. Many have attempted to condense schedules and improve execution while maintaining quality by looking for gains across first silicon bring-up, characterization, and production test. Explore the successes and failures in these attempts and address their common traits. | 15:00 | Performing Pattern Validation and Failure Analysis Without Using Traditional ATE Tobias Graf, TEXAS INSTRUMENTS Traditional automated test equipment (ATE) typically has been used to debug and validate patterns before using them in production, as well as for performing failure analysis. Texas Instruments has found a more cost-effective and agile approach. During this session, learn about our past way of working, the reasons for changing that approach, and the benefits we have seen from the new method. | 15:45 | Coffee Break - Exhibition | |
16:15 | Reducing the Cost of Built-In Self-Test (BIST) Validation Amine Ltaief and Philippe Cavallera, STMICROELECTRONICS At STMicro, we take advantage of BIST to undertake characterization and production test of microcontrollers, including the increasingly important analog features. Our SoftBIST solution is loaded at runtime - it is capable of highly flexible input parameters, with results retrieved as a contextual output from the device. Traditionally, validation of the BIST requires expensive time on production test ATE systems. As a result, it is not always possible to achieve 100% validation coverage, due to a lack of automation. This can lead to expensive problems being discovered once a device is in production. In the session we will show how we overcame these challenges in the lab by using PXI (Including the NI Digital Pattern Instrument and NI Source Measure Unit) and NI TestStand. | 17:00 | Improving the Semiconductor Design to Test Workflow George Zafiropoulos, NATIONAL INSTRUMENTS NI is partnering with semiconductor design tools technology leaders to improve the overall flow from product concept to production. Learn from NI and Cadence Design Systems about semiconductor data management and analysis tools. Also discover the benefits of building linkages between pre- silicon design verification and test platforms. | 17:45 | Networking | 19:00 | Evening Party |
Automotive (ADAS /AUTONOMOUS DRIVING) More detailed information around Automotive can be found here 08:30 | Registration | 09:30 | Full Force Ahead: Opening Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | What's new from NI in Automotive? Daniel Riedelbauch, NATIONAL INSTRUMENTS As vehicles move toward Autonomy, Connectivity and Electrification (ACE), the complexity of the technology being integrated in them is accelerating at an incredible pace. The test methods of the past cannot keep up with the current rate of technology change. In this track opening session, we will provide an overview on the investments that NI is making into the area of Automotive to put you ahead of the game solving these test challenges (Electric Vehicle related topics will be covered in the track opener on Thursday). | 12:00 | Empowering Autonomous Driving/ADAS teams in silicon Valley to shorten delivery timelines of complex systems by applying continuous validation methods Florian Rohde, IPROCESS LLC The pace in the automotive industry gets higher and higher when it comes to software development and delivery. Especially autonomous features will require continuous updates in order to deliver new features and improve performance and safety. Continuous Validation methods can accelerate the delivery by using Continuous Integration practices common in silicon valley tech companies and tailor them towards complex automotive systems. Florian has 15 years of experience working on Validation Test in the Automotive industry and has held various positions at Continental, Tesla and NIO. | 12:45 | Lunch Break | 14:15 | How NI’s platform enables a unified ADAS Test Workflow Ashish Naik, NATIONAL INSTRUMENTS In this session we will explain the different areas of test required to bring ADAS/AD systems to market, and highlight customer examples who have the leveraged the NI unified test architecture. | 14:40 | HIL-Based Validation of ADAS and AD Systems in the ZF Group with PXI Simulation Setups Thomas Herpel, ZUKUNFT MOBILITY GMBH Modern advanced driver assistance systems (ADAS) and autonomous driving platforms (AD) require a sound validation on all development stages—from software coding to full vehicle-system integration. For hardware-in-the-loop (HIL)-based ECU, system and function validation in up-to-date development projects in the ZF Group, this talk provides some insight to the challenges in test system development and how to utilize NI PXI platform modularity, scalability, and performance to achieve ambitious validation goals. | 15:00 | Using Virtual Testing to Develop Driving Assistance Systems Diego Carvalho and Ondrej Zeman, VALEO Learn about VOSSTREX, the virtual environment Valeo developed to create test scenarios, a hardware-in-the-loop (HIL) software and hardware architecture based on NI hardware (a PXI chassis with FPGAs and an external GPU connected to the PXI). Thirdly, view a live demo of the HIL, showing how it can speed up the validation process. | |
15:25 | Closed-Loop, Connected Autonomous Vehicle Perception and Connectivity Testing Using High-Fidelity Synthetic Environments Jakobus Groenewald, WARWICK MANUFACTURING GROUP By validating L3+ connected and autonomous vehicles in simulators, you can create a virtually limitless number of flexible, repeatable, and safe-to-execute testing scenarios. Learn the essential elements of such a driving simulator, including gathering and merging simultaneous real-time data about the driving and connected environment, and sending the data to the vehicle under test. Find out how the WMG 3xD Simulator for Intelligent Vehicles achieved this by cosimulating multiple vendor technologies. | 15:45 | Coffee Break - Exhibition | 16:15 | One-Stop Test Solution for Autonomous Driving: Multidomain Hardware-in-the-Loop and Sensor Simulation Frank Heidemann, SET and Michael Konrad, KONRAD TECHNOLOGIES Active safety systems require millions of miles of test-drives to meet safety requirements. But acquiring road data is extremely expensive, and there’s no guarantee that you’ll encounter every scenario while you perform test-drives on the road. Also, there's no safe way to inject errors into a safety-critical system while you’re driving a vehicle. You can move these safety-critical systems from the road to the lab table with ADAS iiT’s technology. The challenge with ADAS test systems today isn’t having hardware in the loop (HIL) or having target simulators. It’s not having all of these things in one test system. Another challenge is a closed-loop test environment. In the past, automotive testers could record scenarios on the street and play them back to an electronic control unit (ECU) to the test software, but they were stuck in the moment. They couldn’t drive on or change the test scenario. It’s also a challenge to get all vehicle sensors synchronized onto one timeclock. Learn about an opportunity to help automakers solving that problem. See a demonstration of a closed-loop vehicle testing scenario with synchronized modeling, so that customers can integrate sensor fusion in an environment that allows virtual test-driving. Also discover ways of synchronous vehicle-sensor simulation—over the air or on bus level, and find new strategies for flexible fault insertion on physical or protocol level. | 17:00 | Testing Radar Sensors—Solutions for Validation and Production Ludwig Mair, NOFFZ TECHNOLOGIES In this session on testing radar sensors, learn how to meet current and future test solution and concept challenges, including test time reduction; increased frequency bandwidths; integrating target simulation; mechanical accuracy in sensor motion; chamber-reflexion suppression, floor-space reduction, and customized process automation. | 17:25 | The Connected Car—V2X Validation for 802.11p/DSRC and C-V2X/LTE-V Gerd Schmitz, S.E.A. DATENTECHNIK GMBH Vehicle-to-Everything (V2X) communication is based on specific wireless standard protocols 802.11p/DSRC or C-V2X/LTE-V. S.E.A. has proven to successfully cover all aspects of V2X testing, applying the NI platform and software defined radio. Learn about existing V2X testing solutions and success stories, from RF measurements to integrated hardware-in-the-loop test for autonomous driving. | 17:45 | Networking | 19:00 | Evening Party |
Academic / TeachingThe Academic track focuses on both research and teaching applications from professors partnering with NI to make lasting changes. During day one, you will hear from educators on how they are elevating their reputations, motivating students and implementing new methodologies to teach students complex topics. More detailed information around Academic can be found here 08:30 | Registration | 09:30 | Full Force Ahead: Opening Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | Multidisciplinary Project-Based- Learning Nancy Dib, NATIONAL INSTRUMENTS
Discover how universities are transforming engineering education to meet the needs of future innovators by designing and developing progressive programs.
Explore in-depth case studies including the generational transformation of Oklahoma State University and the exciting journey that the hyperloop and formula student competition winners have experienced. | 12:00 | There's (More Than) Music in the Air: Low-Cost, Hands-On Teaching of Software Defined Radio Professor Georg Eggers, UNIVERSITY OF APPLIED SCIENCES Due to its flexibility in modulation and demodulation of RF signals, software defined radio (SDR) has become a key issue in many fields of wireless data transmission. It should therefore be included in up-to-date lectures on signal processing but the substantial prices of commercial programmable SDR-hardware make it difficult to provide hands-on experiences with SDR to many students. However, recent hardware developments promise to make real-live SDR available at very low cost (between $10-$200 USD). This talk will introduce the SDR basics and show up the possibilities to integrate low-cost SDR hardware into the LabVIEW environment for teaching purposes. It will then discuss the potential and the limits of such hardware by means of different wireless communication standards. This shall include live demonstrations (as far as the conference room’s shielding situation allows …).Presentation material and LabVIEW software examples will subsequently be made available from: http://www.georg-eggers.de/labview4lectures | 12:45 | Lunch Break | 14:15 | Federated Remote Laboratories and NI ELVIS III Professor Timothy Drysdale, UNIVERSITY OF EDINBURGH Remote laboratories complement traditional laboratory teaching to provide additional active learning, new pedagogical opportunities, and improved social factors such as widening participation and supporting inclusivity and diversity. Alongside their obvious use in distance learning, they are becoming increasingly important to blended learning on conventional campuses, to support out-of-hours working, make-up sessions, and community engagement. Pedagogical opportunities include the development of inquiry skills and deeper engagement with the materials through exploratory investigations, automated evaluation to assist teachers in making timely and appropriate interventions or provide feedback on demand, and future possibilities for authentic assessment that displaces exams in appropriate cases. Such initiatives are further complemented by virtual laboratories that replay prerecorded data from research-grade tools and simulated laboratories. There are now several excellent implementations of remote laboratories, many using National Instruments products, as well as virtual and simulated laboratories. Educational outcomes measured to-date indicate the value of these approaches. However, to increase the reach of remote laboratories, they need to be included in courses that do not have access to remote-laboratory technology experts. Ideally, educators would not need to learn more than one portal to obtain all the necessary remote, virtual, and simulated laboratories they need on their course, with benefits such as federation of equipment between institutions, increasing utilisation, throughput, diversity of laboratories available, and reliability. This talk outlines progress to-date in developing a vision for the benefits, challenges, and opportunities for federated remote, virtual, and simulated labs for the next era in education, as well as touching on additional software components required to fully develop the potential of NI ELVIS III in remote deployments that go beyond Measurements Live. | 15:00 | Academia-Industrial Co-Production for Education Martin Ekström, MÄLARDALENS HÖGSKOLA and Henrik Falk and Niklas Persson, MALARDALEN UNIVERSITY Mälardalen has a long track record of collaborating with our industrial partners in both our research projects and education. One way we do this is through coproduction, the act of getting those impacted by the research involved in the research. This has given us a huge benefit by introducing real industrial problems into our classrooms, closing the gap between industry, education, and research. Learn how we have set up our robotics teaching courses using the idea of coproduction with industry. | 15:45 | Coffee Break - Exhibition | |
16:15 | Building a Synchronous Generator Test Bench for Teaching from Scratch in Six Months Sergii Levitov, FORMER TECHNICAL UNIVERSITY OF MUNICH STUDENT As part of my master’s studies at the Technical University of Munich I was tasked with developing a test bench for a synchronous generator that future TUM students could use in their lab modules. With no prior experience with LabVIEW it was initially daunting, but I discovered after a short period of time that executing such a complex project with LabVIEW and NI FPGA hardware was not as complicated as initially thought. I’ll share my experience and show how you and students can build teaching tools quickly and efficiently. | 17:00 | Save Onboarding Costs Through an Industry-University Partnership Wolfgang Rominger, NXP SEMICONDUCTORS AUSTRIA and Thomas Messner, FH JOANNEUM Onboarding graduates is usually a costly process. You must introduce them to the company culture, processes, and tools. The FH JOANNEUM and the validation team of NXP Austria are collaboratively working to close the gap between education and industry. Engaged students are offered thesis projects to strengthen their LabVIEW skills. | 17:45 | Networking | 19:00 | Evening Party |
{C} NI Software 08:30 | Registration | 09:30 | Full Force Ahead: Opening Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | What's New in TestStand 2019 and Veristand 2019 Kevin Flanagan, Chris Ficklin, Marcelo Izaguirre, NATIONAL INSTRUMENTS
Examine the new features of TestStand 2019 and VeriStand 2019. Learn how application enhancements can help improve your productivity and how both environments can interact to help you rapidly build scalable, maintainable test systems. | 12:00 | Empowering TestStand with DQMH® Corinne Doppmann and Jascha Eisenberg, ZÜHLKE Learn about the proven approach of combining the Delacor Queued Message Handler (DQMH®) with TestStand. | 12:45 | Lunch Break | 14:15 | LabVIEW-Python Integration with Python Nodes Danielle Jobe, VI Technologies Learn how to use LabVIEW Python nodes to call Python functions within LabVIEW. See how data types are transferred between the languages, learn how to avoid some common pitfalls when using Python nodes, and even call some simple machine-learning algorithms to do computer vision. | 15:00 | SystemLink™ Software: Accelerate Software Deployment and System Diagnostics Rupert Donauer, NATIONAL INSTRUMENTS Many organizations rely on time-intensive, error-prone processes for software deployment. However, updating application software does not have to be a barrier to achieving project deliverables and operational efficiency. Learn how SystemLink™ software can reduce your software cycle time and increase your system uptime so you can focus on higher-value tasks. | 15:45 | Coffee Break - Exhibition | |
16:15 | Learn how to create powerful web apps with LabVIEW NXG Web Modul Elijah Kerry, NATIONAL INSTRUMENTS A modern and powerful Web application includes a website front-end (HTML5, CSS, JavaScript) that talks to a Web Server and some Databases. You're not a web developer? Don't worry, with Lab VIEW Web Services and LabVIEW NXG Web Module concurrently, you can now program your entire web application in G! Come to this session to see how! | 17:00 | Automate Measurement Analysis with MathWorks and NI Tools Matthew Friedman, NATIONAL INSTRUMENTS and MATHWORKS INC Learn how to use MathWorks MATLAB® software and its add-on toolboxes to directly interface with NI DAQ hardware and modular instruments. Also discover how to integrate your MATLAB code into LabVIEW using MATLAB interfaces. MATLAB® is a registered trademark of The MathWorks, Inc. | 17:45 | Networking | 19:00 | Evening Party |
Engineering Practices, Architectures and Design 08:30 | Registration | 09:30 | Full Force Ahead: Opening Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | What Software Engineering can learn from Silicon Valley, Asian martial arts and AI Marco Schmid, SCHMID ELEKTRONIK
Abstract will follow soon | 12:00 | Frameworks and More in LabVIEW This session brings together innovative architectures and best practices for LabVIEW based application development with lightning talks from five experts of the LabVIEW community. This includes topics on Unit Testing, UML Based OOPs Design, Bookmarks, Deep Learning and a new framework "WORKERS" - Unit Testing LabVIEW Code - Living and Dreaming Automation - Peter Bokor, IncQuery Labs
- How to be Ultra Productive with OOP in LabVIEW and LabVIEW NXG using UML - Jeffery Habets, VI Technologies
- WORKERS - A New and Innovative Framework for LabVIEW - Peter Scarfe, Scarfe Controls
- Use #Bookmarks - get your review docs for free - Daniela Biberstein, Helbling Technik
- Deep Learning with LabVIEW and Applications - Alik Sargsyan, NGENE LLC
| 12:45 | Lunch Break | 14:15 | Get Team Buy-In: Running Process Improvement Workshops Peter Horn, NATIONAL INSTRUMENTS Developing a new software process and gaining buy-in from all stakeholders is difficult. Learn how to run a workshop with the goal of highlighting the key success criteria and metrics. Also leave with some follow-up work packages to develop your process. | 14:45 | Leverage Windows security from your application Wiebe Walstra, CARYA Security is often ignored in LabVIEW applications. But every now and then, you want your application to have rights the user doesn't have. You'll learn how you can give your application access to databases, directories and files while the user cannot access them. | 15:15 | Understanding Messaging in Frameworks James McNally, WIRESMITH TECHNOLOGY Application frameworks are always a hot topic at LabVIEW events. Actor Framework, DQMH etc. A big problem these solve is how to set up messaging between different processes in LabVIEW. But why do they work? This presentation will take a critical look at different messaging systems and understand the pros and cons and how to make them work for your application. | 15:45 | Coffee Break - Exhibition | |
16:15 | Linux and NI: How This Combination Benefits You Peter Horn, NATIONAL INSTRUMENTS Introducing Linux Real-Time on PXI! Explore new features and learn how you can take advantage of them for your test systems. Also cover the updates NI is making to support common Linux distributions. | 16:45 | Embedded digital twin for production test Gianluca Bacchiega, IRS A digital twin is a real-time digital replica of a physical device. Developing an embedded digital twin using NI Hardware allows superior device diagnostic and failure anticipation. Discover how to implement a twin device for manufacturing production test exploiting real-time monitoring, physical models and machine learning. | 17:15 | Building Smarter Rack-Based Test Systems James McNally, NATIONAL INSTRUMENTS Defining a test strategy is critical to reducing cost and maximizing the efficiency of your product development and manufacturing organizations. Ensure you have the fundamentals to build a smarter test system that can address your needs today and in the future with test engineering best practices for power budgeting and thermal profiling. | 17:45 | Networking | 19:00 | Evening Party |
Certification and Certification Prep-Session for Future ExamsValidate your skills and expertise in LabVIEW/TestStand by registering for the NI Certification exams at NI Days 2019. An additional registration is mandatory here. 11:00 – 12:30 | CLD Prep-Session free to attend Room: Riemer See | 11:15 – 12:15 | 1 Hour Online Exam (CLAD, CTD, CTA, CLD-R, CLA-R, CLED part1) Room: Ostersee | 14:00 – 18:00 | 4 Hour Exam (CLD & CLA) Room: Ostersee |
Thursday, November 21Aerospace & Defence More detailed information around Aerospace & Defence can be found here 08:30 | Registration | 09:30 | The Full Force of the NI Platform Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | Testing at Airbus Military Aircraft Systems Santiago Lopez, AIRBUS DEFENCE AND SPACE
Testing is essential in the development and production stage of every aircraft. Airbus D&S Military Aircrafts has reached a very high level of integration to tightly replicate real-flight operation by interconnecting and synchronizing several aircraft systems rigs. The NI test platform provides us with test results that meet our schedule, cost, and quality requirements, all in a unique test facility. | 12:00 | Gripen E Hardware-in-the-Loop Simulators Using NI Products Eric Karlsson, SAAB AERONAUTICS Hardware-in-the-loop (HIL) simulators are very important for developing and verifying the new Gripen E aircraft. When testing the system in an HIL simulator, the zeros and ones in the computer simulation must be converted to real electrical signals suitable for the device under test. National Instruments controllers and signal conditioning products make these conversions possible. | 12:45 | Keynote Mark Gallagher, Grand Prix Motor Racing executive | 13:15 | Lunch Break | 14:15 | A Flexible Platform for Validation Testing on Electrical Aircrafts Javier Gutierrez, NATIONAL INSTRUMENTS Electrical-based subsystems offer clear advantages over their predecessors, driven by technology advancements in power electronics—but simulating and testing these electric and electromechanical systems presents significant challenges. To fully take advantage of the benefits of electrical systems, you need a test platform and methodology that can address these challenges. Learn more about a platform capable of integrating the latest models and algorithms and an ecosystem of vendors servicing this market, that can perform highly deterministic, real-time simulation routines across hundreds or even thousands of cases and capable of integrating I/O, buses, and even RF comms. | 15:00 | Cutting Edge Test Tools for Cutting Edge Space Processors Francisco Javier Moreno Carrillo and Luis Angel Gómez Fernández, THALES ALENIA SPACE ESPANA The new generation of Telecommunication On Board Processors developed by Thales Alenia Space España are capable of handling complex RF signals adapting to dynamic traffic scenarios in a very agile way. Testing this type of devices means a challenge as we need to generate complex signals with high dynamicity and embedding simulated traffic complex enough to validate the entire Hardware – Firmware – Software data processing chain. The advanced features of the NI RF signal generation devices and tools as well as the solid technical support of NI technical team has been key for the fast and reliable testing of these On Board Processors meeting the high quality standards of the Space business.n | 15:45 | Coffee Break - Exhibition | |
16:15 | NI cDAQ application for civil UAV ground and flight test. Dmitry Soloviov, VR-TECHNOLOGY Learn about the NI CompactDAQ data acquisition system and how it's being used in VRT300 civil unmanned aerial vehicle (UAV) preproduction configuration ground and flight testing. Hear how NI software and hardware solutions implemented upgrades and modifications into the system over the course of testing and incorporated or eliminated certain functions to address specific tasks. | 17:00 | Strategies for Obsolescence Management Planning Ragunandan N V, NATIONAL INSTRUMENTS The surest way to suffer an expensive and risky obsolescence event is to fail to plan for vendor, component, and software end-of-life in your test systems. In this session, we discuss the risks and benefits of different obsolescence-management strategies and best practices for reducing risk in long-life test programs. |
Semiconductor Production More detailed information around Semiconductor can be found here 08:30 | Registration | 09:30 | The Full Force of the NI Platform Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | Semiconductor innovation for smart connected devices – from components to full system solutions Lars Reger, NXP
Semiconductor innovation has stepped up to a new level of complexity. With IoT and Automotive eco-systems evolving towards ever higher standards in sustainability, automation, and connectivity, the market is asking for easy-to-implement, scalable system solutions, rather than individual components. Safety and security by design is seen as the foundation of this evolution. At the same time, quality requirements are being tightened, moving towards true zero defect. This demands for a different view on the development process for ICs, moving beyond traditional approaches. In this session you will hear NXP’s vision on today’s and future system solutions and learn how the company is dealing with these consequences of a rapidly changing market environment. | 12:00 | Leveraging scalable ATE platform for RF WLCSP with NI STS Erwin Platter, NXP Within the product line Smart Antenna Solutions at NXP we strive for leading edge RF device performance at lowest cost of test. Traditional ATE have always had challenges meeting our RF needs out of the box. In this session we will discuss how we could gradually moved from what we had to what we needed, scaling up from PXI to augment ATE to STS T2 and finally now STS T4 for RF WLCSP test.We will cover topics like prober compatibility between T2 and T4 and how our product engineers with help from NI are able to contribute to test developments helping us accelerate time to market. | 12:45 | Keynote Mark Gallagher, Grand Prix Motor Racing executive | 13:15 | Lunch Break | 14:15 | Challenges and Solutions for mmWave OTA Test Mher Minasyan, NATIONAL INSTRUMENTS The 5G industry is seeing more semiconductor devices that operate above 24 GHz, many of which are integrated antenna-in-package (AiP) units that require over-the-air (OTA) test. Learn about the characteristics and challenges of OTA test and the current solutions for fast OTA characterization and manufacturing test. | 15:00 | Successful Semiconductor Wafer Probe Test Solutions for mmWave Production Arne Holland, FORMFACTOR INC Semiconductor wafer probe test requires several elements to be successful. In this session, explore the requirements for the growing RF and mmWave device test applications. Topics include performance requirement trade-offs for cost effective production, probe card design, direct dock interfacing, calibration, and other setup considerations. | 15:45 | Coffee Break - Exhibition | |
16:15 | Challenges in electrical testing of MEMS Sensors Dennis Alveringh and Armando Fernandez, SALLAND ENGINEERING By definition, MEMS chips consist of mechanical structures to sense or actuate a physical quantity in its environment. The readout structures that translate the mechanical movement to an electrical signal are often capacitive. Although most automatic testing equipment are able to measure static capacitance, sampling a varying capacitance at high accuracy and high frequency is a totally different story. Meet the challenges in designing a varying capacitance meter for fully electrical MEMS testing. And find out how we integrate this into a practical PXI based solution. | 17:00 | Achieving Highly Effective Test Flows for MEMS Test with NI PXI-Based ATE Ari Kuukkala and Markku Sirén, AFORE OY Chip-scale-packaging (CSP) technologies are gaining popularity for microelectromechanical systems (MEMS), but engineers with traditional test systems are challenged by the small size of the sensor and constant pressure to reduce costs. They need solutions that can test and calibrate the sensor with real stimuli at high accuracies. Learn how we build such a solution by integrating the NI PXI platform into a handler. |
Automotive (VEHICLE ELECTRIFICATION) More detailed information around Automotive can be found here 08:30 | Registration | 09:30 | The Full Force of the NI Platform Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | What's new from NI in Electric Vehicle Test? Daniel Riedelbauch, NATIONAL INSTRUMENTS The electrification of powertrains is getting a complex issue in the automotive industry due to consumer preference for the non-fuel efficient vehicle such as SUV as well as variations of fuel and exhaust gas regulations from each country. Next to the range of Battery Electric Vehicles (BEV) the cost of the battery is most critical challenge in development and testing can play a critical role here. In this track opening session, we will provide an overview on the investments that NI is making into the area of Electric Vehicle to put you ahead of the game solving these test challenges. | 12:00 | Considerations for Solving Battery-Testing Challenges Stefan Menacher, TÜV SÜD Because lithium-ion batteries are increasingly used in the automotive industry, the demand for performance, environmental responsibility, and life-cycle tests increases, along with test-procedure complexity. You need highly integrated test systems that respect dynamically changing battery parameters and have the ability to control cooling systems and other measurement systems beyond power electronics. View a modern test bench setup for testing lithium-ion batteries from TÜV SÜD Battery Testing GmbH. | 12:45 | Keynote Mark Gallagher, Grand Prix Motor Racing executive | 13:15 | Lunch Break | 14:15 | Battery Power for Sustainable E-Mobility Domenic Foerderer and Maximilian Schultz, PRONES AUTOMATION GMBH Hybrid and electric vehicles benefit from a liquid-cooled and freely scalable system that not only meets the highest safety standards, but also is currently one of the most powerful battery solutions in the world: Akasystem by Akasol AG.To continue their success story, Akasol is cooperating with the LabVIEW experts of ProNES Automation GmbH to assure high-quality, precise, and digitised battery production.Convince yourself of a collaboration that will drive the e-mobility of tomorrow. | 14:40 | Testing High-Voltage Battery Packs in a Production Environment [EOL] Markus Zacherl, BERGHOF AUTOMATION GMBH As high-voltage storage systems become more powerful, they must meet greater demands, including higher capacities and higher charging voltages or currents. Thanks to appropriate source-sink systems, as well as state-of-the-art test programs, we can test this new technology. Our high-voltage battery test system records and evaluates measured values so that they can be reproduced at any time and used for quality control. Security-relevant data is precisely logged and can be transferred to various database systems. Simple and safe test-system operation guarantees worker safety and prevents sources of error, even in fully or semiautomatic test procedures. | 15:00 | Battery Cycle Testing – Measurement Principles and real-world Case Study Martin Sveningsson, WIREFLOW Lithium-ion battery technology is becoming more and more widespread. In high-power applications (such as automotive), there is a need for organizing cells in modules to manage monitoring, balancing and safety for technicians. Battery pack manufacturers build systems with multiple modules and need to cycle test them to verify that the system, as well as the modules behave as expected and stays within specifications over time. WireFlow has designed and built test rigs that safely cycles battery packs for several months. Some of the challenges in the system design was the large amount of log data, automatic shutdown and electrical isolation. To solve those challenges the systems were designed around a CompactRIO and a dedicated battery stack monitoring C-series module, the WF-3169. | |
15:25 | Cost and energy efficient hardware simulation of electrical motors for inverter test Michael Rost, IRS SYSTEMENTWICKLUNG GMBH Hardware simulation of electric motors in lifetime test of power inverters for electrical vehicles. Deployment of a cost and energy efficient setup for multiple test stations in parallel. The System is based on NI RIO Technology and power electronics for flexible applications both for 48V and High Voltage Systems, for 3-phase and 6-phase Inverters. | 15:45 | Coffee Break - Exhibition | 16:15 | Electric Drive Test and Validation Ravinder Venugopal, OPAL-RT As an increasing number of electric motors are being used in critical automotive functions ranging from automated steering to traction drives, the development, testing, and validation of the associated motor controls and power electronics is becoming an area of heightened importance. The use of real-time simulation technology, which underlies rapid control prototyping and hardware-in-the-loop testing, helps accelerate, cost-optimize and derisk the implementation of advanced motor control algorithms and the next generation of power electronics.The fast dynamics of motor drives present a challenge for control and simulation, and combined CPU/FPGA architectures are necessary to handle the associated computational complexity. In this presentation, learn about the state-of-the-art in real-time simulation of motor drives with two case studies: Obtain the computational performance required to simulate motor drives in real time with sufficient fidelity and optimize hardware architectures, models, numerical solvers, and software implementation. Furthermore, discover how to address latencies and synchronization when models are distributed over multiple computing engines (CPU cores and FPGAs). | 16:40 | Electric Vehicle Motor All-in-One Inline Test Solution Marcin Chrusciel, AVERNA Averna’s electric vehicle (EV) motor test solution covers a wide range of performance and functional tests. It is designed to be an all-in-one test station seamlessly integrated into an EV motor production line. The solution is fully automated and energy efficient. It is also easily scalable, thanks to the NI data acquisition and control platform. The solution features modular design to adapt to the new EV motor production line with minimized engineering effort. | 17:00 | High-Voltage Application in Full-Scale Hardware in the Loop for Electric Vehicle Motors Mikael Bedemo and Roger Johansson, ALIARO Learn about a case study that recently implemented high-voltage electric engine validation and simulation in a complete vehicle integration hardware-in-the-loop system for an automotive customer in Sweden/China. | 17:25 | Validating a DC/DC Converter Using NI Real-Time Hardware in the Loop Jihas Khan, TATA ELXSI The advent of hybrid, fully electric vehicles has increased vehicle and internal-system complexity. Each subsystem has considerable influence on surrounding systems. A DC/DC converter is a key component to transfer power from the high-voltage side to the low-voltage side. However, it is a major component with different functionality and operational voltage, depending upon the type of vehicle (battery electric, hybrid, or mild hybrid). In a battery-electric vehicle, the DC/DC converter converts power from the high-voltage side to 12 V, so it can be unidirectional. In mild hybrid, the same DC/DC converter performs more functionalities, such as E-start/stop, precharge, and torque assist. The DC/DC converter hardware-in-the-loop solution built with Tata Elxsi’s competency and state-of-art NI analog and FPGA-based I/O modules makes it viable to validate the system at both signal and system level. The system architecture can be customized for battery electric vehicles and hybrid vehicles with little effort. In the signal-level solution, the 100-150 kHz PWM signal is captured by the NI FPGA 7856R and is fed to the buck-boost power conversion model created with the power of LabVIEW. In addition, the higher-level control algorithm that depends on the drive cycle and other external parameters can also be validated. In the system-level test solution, all key performance indicators of the DC/DC converter are validated with the aid of custom board of sensors, high-voltage power supply/battery, and DC electronic load. The scalability of NI I/O cards and the power of LabVIEW made the system design much more flexible. |
Academic / ResearchThe Academic track focuses on both research and teaching applications from professors partnering with NI to make lasting changes. During day two, you will hear from researchers on the outcome of partnering with industry, applying research for real world problems and laying out the path ahead for greater innovation tomorrow. More detailed information around Academic can be found here 08:30 | Registration | 09:30 | The Full Force of the NI Platform Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | From University Quantum Research to Successful Start-up Business Alessandro Pioda, SPECS ZURICH and Mahmoud Wahby, NATIONAL INSTRUMENTS Minimizing time to result is a crucial aspect in a very competitive field like academic research. That increases pressure on scientists even more, yet often they have to rely on outdated and unreliable tools to successfully achieve their goals. 16 years ago a small team of researchers decided that using twenty-year old technology to develop the next generation of advanced materials and nanodevices simply wasn’t good enough and were able to turn their work into a small startup business. This talk will discuss the path from a basement laboratory to the leading supplier of control systems for high-end scanning probe microscopy, and how that experience could be used to rapidly develop an advanced measurement system for quantum computing research. | 12:00 | Wireless Prototyping with Software-Defined Radio Paul Harris, NATIONAL INSTRUMENTS
From fundamental research to standards-aligned test solutions, for many years NI has been facilitating the journey to 5G with software-defined radio prototyping solutions. In this session you will learn about some of the trends in wireless prototyping, the common challenges researchers face, and the approach NI has taken with Software-Defined Radio to enable rapid innovation. | 12:45 | Keynote Mark Gallagher, Grand Prix Motor Racing executive | 13:15 | Lunch Break | 14:15 | ATLAS—LiDAR Measuring for Salt Warehouses Thomas Messner, FH JOANNUM As part of a research project, a measuring system for salt storage halls of the Austrian motorway company ASFINAG was developed. A prototype of the measuring system has been in operation for one year and is to be implemented in all ASFINAG salt warehouses in Austria within the next two years. The measuring system determines the salt volume by means of several 3D LiDAR measuring devices. The central control system is a National Instruments cRIO while the complex calculation was realized with LabVIEW. The development and functionality of the measuring system will be presented in this presentation. | 15:00 | TUM Center for Combined Energy Systems (CoSES) microgrid laboratory Dr. Vedran Perić, TECHNICAL UNIVERSITY OF MUNICH
A holistic approach in design, operation and control of energy systems has be recognized as a key enabler of the successful energy transition. TU Munich Center for Combined Energy Systems (CoSES) microgrid laboratory is a unique facility for integrative studies of electric distribution grid, heat and cooling system and electric mobility. Relying on the PXI systems, the laboratory implements the VeriStand development cycle philosophy, which enables fast prototyping and validation of different control schemes in real-life conditions. | 15:45 | Coffee Break - Exhibition | |
16:15 | Experiment Control Software for Ultra-Cold Atom Based Quantum Accelerometer Dr. Theodor Krastev, IMPERIAL COLLEGE LONDON
During the absence of GNSS signal, conventional accelerometers and gyroscopes are being used. The accuracy and stability of these devices in inertial sensing are limited by their intrinsic bias drift. Laser cooled atoms promise an attractive solution to this problem. Hear about how Imperial College London’s team have designed and controlled of the UK’s first quantum accelerometer which uses cold Rubidium-87 atoms for the precise measurement of acceleration. A horizontal acceleration sensitivity of 4 μg (1g = 9.8 m/s2) in 1 sec of measurement integration time was achieved. | 17:00 | 5G Network Digital Twin Stephen Douglas, SPIRENT
Digital Twins are not a new concept and have been used in aeronautics, manufacturing and building design to help simulate complex systems. As 5G moves us from being a physical network to a living system it is time to embrace the power of the Digital Twin. This talk will discuss how the 5G Network Digital Twin can transform CSPs operational cycles and share real-world use cases on how it is being envisaged by future 5G enabled industries such as Industry 4.0 Smart Factories, automotive and Government/University research. |
NI Software 08:30 | Registration | 09:30 | The Full Force of the NI Platform Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | What's New in LabVIEW 2019 and LabVIEW NXG Birgit Adams, NATIONAL INSTRUMENTS
Drive efficiency in your workflow with LabVIEW 2019 tools that simplify system integration and accelerate productivity. With LabVIEW NXG, you can test smarter by configuring, automating, and visualizing your results all within a single tool. See how to use the new features in both LabVIEW versions to develop at the speed of innovation. | 12:00 | Information to follow soon | 12:45 | Keynote Mark Gallagher, Grand Prix Motor Racing executive | 13:15 | Lunch Break | 14:15 | Introduction to the LabVIEW Community Edition Elijah Kerry, NATIONAL INSTRUMENTS Learn how to use hobbyist hardware like Arduino, Raspberry PI and BeagleBone with LabVIEW for free and build rich web-based user interfaces. NI will be introducing the LabVIEW Community Edition next May, but come to this session to learn about this new product and see examples of how to put these features to work in your home hobby projects today. | 15:00 | Expand the LabVIEW IDE to Meet Your Needs Tom McQuillian, SCIENTIFICA LTD Work smarter, not harder!In this session I’ll go through how to customise your LabVIEW environment to do common development tasks for us. This includes customising and writing right-click menus, toolbars, quick-drop shortcuts and much more. In this presentation I’ll be sharing with you tools I’ve developed to extend the LabVIEW environment and how to develop your own.This session will also serve as a detailed introduction to LabVIEW Scripting to automate the development of common software tasks. | 15:45 | Coffee Break - Exhibition | |
16:15 | VI Analyzer: The Unsung Hero of Software Quality Control Chris Roebuck, KONRAD TECHNOLOGY Explore VI Analyzer features and learn how to easily incorporate it into your workflow using project provider hooks for enhanced IDE integration. Also learn how to implement and deploy custom VI Analyzer tests and create tests that automatically fix the failures they encounter. | 17:00 | Open-Source LabVIEW Projects Jörg Hampel, HAMPEL SOFTWARE ENGINEERING Learn about open-source projects and successful real-life applications in this session. See how open-source projects work—especially in the LabVIEW ecosystem—and how to initiate a public open-source project and drive collaboration on it by example of the very successful G Command-Line Interface (G-CLI) project. Discover how to leverage open-source tools and processes (for example, source-code control and workflow models) to improve collaboration inside your and your customers organizations. |
Engineering Practices, Architectures and Design 08:30 | Registration | 09:30 | The Full Force of the NI Platform Keynote | 10:45 | Coffee Break - Exhibition | 11:15 | Introducing NI First Wireless Sensor Noemi Savoia, NATIONAL INSTRUMENTS The use of wireless instrumentation is increasing as organizations retrofit existing systems to reduce the cost and complexity of data collection. NI is introducing a wireless vibration sensor that contains an integrated MEMS accelerometer, battery, and radio designed to monitor rotating machinery. | 11:45 | Tips and Tricks for Using TSN With NI Hardware Daniel Clapham, NATIONAL INSTRUMENTS Explore fundamental concepts for using Time Sensitive Networking on FieldDAQ, CompactDAQ, CompactRIO, PXI, and Industrial Controllers. Learn advanced debugging and monitoring techniques for maintaining a distributed application. View live demos of synchronized, multidevice DAQ and deterministic Ethernet communication between targets. | 12:15 | Sensor Programming Unit (SPU) – an FPGA-based solution to high-channel, custom protocol sensor programming Markus Schneider and Andreas Scholz, DATA AHEAD Interfacing with sensor devices in automated test and validation can become a difficult task due to high-channel count (Multi-DUT), lower cost requirements, and variety of sensor interfaces (such as SENT, PSI5, DSI3, PWM, CUSTOM). Traditional test strategies need to be replaced with flexible, scalable and parallel testing to reduce test times and time-to-market. Sensor Programming Unit (SPU) is a scalable, flexible sensor interface based on a modular PXI FPGA platform. A sensor-specific front end physical layer interface performs signal conditioning and digitization and protocol stacks implemented on an FPGA process up to 40 sensors in parallel while monitoring power, capacity and sensor data. | 12:45 | Keynote Mark Gallagher, Grand Prix Motor Racing executive | 13:15 | Lunch Break | 14:15 | Data and Systems Management Stefan Romainczyk,NATIONAL INSTRUMENTS Data and Systems Management has become an essential aspect of all Test and Measurement Systems due to increased focus on Digital Transformation across organizations. Hear how National Instruments can help you set up the infrastructure needed to manage data from various sources, systems, and assets efficiently for teams and organizations. | 15:00 | Data Management Workflows - going through Scripting for Serverside analysis Stefan Romainczyk, NATIONAL INSTRUMENTS Automated Data Management tools help you gain maximum insights from gigabytes of Big Analog Data. Learn how to interact and create data management workflows from desktop to cloud with NI Data Management tools. Hear how to standardize data across teams, mine it for useful information, transform it with automated analysis, and deliver reports with helpful information. | 15:45 | Coffee Break - Exhibition | |
16:15 | Condition Based Maintenance in the IIOT Ian Fountain, NATIONAL INSTRUMENTS Adopting modern technology for machine health monitoring can help your maintenance team unlock days of production, shift to a more efficient sparing strategy, and push out scheduled preventative maintenance. In this session, learn the fundamentals of rotating equipment measurements and explore how the adoption of IoT technologies is leading to more production time. | 17:00 | Leverage SystemLink™ for Machine Learning Vishnu Prasad, SOLITON TECHNOLOGIES Abstract will follow soon |
Certification Prep-Session for Future Exams
11:00 – 12:30 | CLA Prep-Session free to attend Room: Riemer See |
|
|