title> NI Automotive Forum Hungary - National Instruments
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Please find the preliminary agenda below. It will be updated with more details continuously.
Testing ADAS
08:30
Registration and Welcome Coffee
09:00 - 09:30
Keynote -
A new era of mobility is upon us, make sure you’re ready for it [EN]
by Attila Peter, Regional Sales Manager, National Instruments
09:30 - 10:30
Take advantage of a platform based approach for Automotive Test from V&V to Production [EN]
by Lorenz Casper, Field Marketing Manager - Automotive, National Instruments
10:30 - 11:00
Coffee Break and Exhibition Visit
11:00 - 11:45
Techniques for ADAS Testing - Simulation, HIL Testing, Record and Playback [EN]
by Daniel Riedelbauch, Go to Market Manager Automotive, National Instruments
11.45 - 13:00
Lunch and Exhibition Visit
13:00 - 13:45
Combine Sensor Fusion HIL with Measurement-based Tests to meet Test Challenges for Autonomous Driving [EN
]
by Robin Irwin, Managing Director, Konrad Technologies
13:45 - 14:30
Developing ADAS Systems and Components Tests such as e.g. Radar for Production purposes [EN]
by Noffz Technologies
14:30 - 15:00
Coffee Break and Exhibition Visit
15:00 - 16:00
Mix & Discuss
Choose one out of 8 deep dive topics and elaborate each with experts from the whole conference participants. You will have 60 Minutes for discussion including a preparing a report out that will be shared later that day.
16:00 - 16:30
Summary of Mix & Discuss
16:30 - 17:30
Drinks Reception & Exhibition Visit
Hardware in the Loop
8:30
Registration and Welcome Coffee
09:00 - 09:30
Keynote - Test the Vehicles of Tomorrow [EN]
by Attila Peter, Regional Sales Manager, National Instruments
09:30 - 10:30
Take advantage of a platform based approach for Automotive Test from V&V to Production [EN]
by Lorenz Casper, Field Marketing Manager - Automotive, National Instruments
10:30 - 11:00
Coffee Break and Exhibition Visit
11:00 - 11:45
Increasing Testing Speed and Coverage with a Platform based approach to HIL [EN]
by Jiri Keprt, Principal Application Enginner, National Instruments
11:45 - 13:00
Lunch and Exhibition Visit
13:00 - 13:45
Using VeriStand to create a reusable Test Framework - explained on a Real-Time Durability Test Example [EN]
by Pawel Reszel, Head of Buisness Development, Sparkflow sp. Z o.o. sp. K.
13:45 - 14:30
Utilize NI's Simulation capabilities for HIL [EN]
by Jiri Keprt,Principal Application Enginner, National Instruments, Driss Rimi, Regional Sales Manager Opal-RT
14:30 - 15:00
Coffee Break and Exhibition Visit
15:00 - 16:00
Mix & Discuss
Choose one out of 8 deep dive topics and elaborate each with experts from the whole conference participants. You will have 60 Minutes for discussion including a preparing a report out that will be shared later that day.
16:00 - 16:30
Summary of Mix & Discuss
16:30 - 17:30
Drinks Reception & Exhibition Visit