9:00 - 10:00 AM | Registration | BREAKFAST | EXHIBITION |
10:00 - 10:45 AM | Keynote: Bridging the Gap Between Characterization and Production Test Semiconductor device manufacturers face continual pressure to reduce time to market and costs, yet organizational boundaries and siloed knowledge bases force costly reimplementation of IP and rediscovery of best practices between different functions in the product development flow. You can help break down these silos by standardizing on a common platform of extensible tools that can be used across groups throughout the labs and production, ultimately leading to faster delivery of products to market and becoming more agile to an ever-changing world of new requirements. |
10:45 - 11:30 AM | Characterizing Power and Performance on High-Performance ICs The continued importance of testing power usage and power efficiency of today’s high-performance ICs brings new test challenges as semiconductor devices improve their designs and scale to higher channel counts. This is especially true in devices such as application processors, power management ICs, and power amplifiers. We will discuss some of the use cases and how to make power measurements under varying operating conditions to better characterize power vs. performance. |
11:30 - 11:45 AM | Networking Break | Exhibition |
11:45 AM - 12:30 PM | Improving Optical Device and Component Test In order to increase performance, lower costs, and achieve greater energy efficiency, PICs and silicon photonic technologies are expanding in use. The integration of photonic and electrical components present many new challenges for test engineering that we will explore and share solutions covering both optical and electrical test that scale from the lab to manufacturing. |
12:30 - 2:00 PM | Networking Lunch | EXHIBITION |
2:00 - 2:45 PM | Optimizing Test for Wideband 5G Devices in the Lab and Production New wideband 5G RFIC designs require test solutions that optimize measurement uncertainty, test time, and cost. We will discuss the top test challenges for wideband 5G devices operating below 6 GHz (FR1) and at mmWave frequencies (FR2). We will also demonstrate these test solutions for RFICs ranging from power amplifiers, beamforming ICs, and wireless transceivers. |
2:45 - 3:00 PM | Networking Break | Exhibition |
3:00 - 3:45 PM | Latest Trends on Testing Wireless IoT: WLAN, BT and NB-IoT Market demands for higher data throughput, better battery efficiency, and improved connectivity continue to push the development of wireless connectivity standards. We will explore the challenges and best practices in testing the PHY performance of semiconductor devices for three key standards: WiFi 6 (802.11ax) and its future revision, 802.11be (Extreme High Throughput); Bluetooth 5.1, and Narrowband Internet of Things (NB-IoT). |
3:45 - 5:00 PM | RECEPTION | EXHIBITION |
*Agenda is subject to change