The aerospace and defence track at NIDays Eurpoe features industry leaders presenting sessions that span applications from hardware-in-the-loop (HIL) test to electronic warfare. Hear insightful perspectives and get answers to your questions from a variety of presenters including NI engineers, partners, and users. From discussions of trends and best practices to specific technology experiences and recommendations, NIDays Europe inspires and empowers you with practical knowledge you can use immediately.
Aerospace and Defence Technical Sessions
A full conference pass is required to attend these and other technical sessions.
Wednesday, 20 November 2019
|10:45||Coffee Break - Exhibition|
Transmitter Control Unit Development with NI PXI and FlexRIO
Armando Arenai, EUROPEAN DEFENCE ORGANISATION
During the 12 months before the first deployment of a state-of-the-art solid-state modulator, we needed to architect, develop, and test a replacement transmitter control unit to manage the operation of the modulator’s radar transmitter. We took advantage of highly flexible, reconfigurable NI R Series and FlexRIO products and the short development cycle of LabVIEW FPGA, which offered the perfect solution to meet deadlines and provide inherent savings compared with other commercial off-the-shelf or custom products.
Building a PXI-Based Real-time Radar Target Simulator to Test Complex Radars from the Ground Up in Three Months
Avinash Chenreddy and Satya Gopal Panigrahi, CONSTELLI
Today’s complex radars demand sophisticated solutions to test their functionalities and signal-processing abilities. Learn how engineers at Constelli have developed an advanced radar target simulator with range, velocity, RCS, antenna pattern, and multitarget trajectory simulation using the NI PXI RF platform and NI LabVIEW FPGA from the ground up in three months.
Modular Test Solutions Supporting Platform Integrators and EW Sensor Manufacturers
Dr. Massimo Sciotti, ELETTRONICA
The wide availability of high-performing commercial-off-the-shelf hardware units has paved the way for building reconfigurable, general-purpose architectures that serve multiple test and evaluation (T&E) purposes. Ranging from design support to on-site validation, including sensors verification before integration on the platform, National Instruments devices easily can be composed into complex T&E solutions to fully meet user needs related to state-of-the-art and next-generation EW, ISR, COM and NAV sensors. Simulation and real-time processing techniques, which can be integrated in the NI hardware or developed using plug-in architecture, are key. Scalability, reconfigurability, and customization are the important features of NI T&E assets. View examples and applications of evolving test requirements in EW/ISR.
Verification and Validation of Active Electronically Scanned Arrays for 5G, Satellites, and Defence Applications
Marco Lisi ,Chris Behnke , INDEPENDENT EUROPEAN COMMISSION EXPERT, NATIONAL INSTRUMENTS
Active electronically scanned arrays (AESAs) are a key technology for advanced RF/microwave systems in navigation, communications, radars, and electronic warfare (EW). This presentation details broadband, multichannel, phase-coherent digital test setups, based on National Instruments technology, suitable for the development, verification, and validation of complex AESA systems.
Coffee Break - Exhibition
EGSE and SCOE Test Systems for Satellite Integration
Christian Korreng and Bernhard Altvater, LXINSTRUMENTS
In this technical presentation, learn how LXinstruments developed complex, scalable test and validation systems used in electronic ground support equipment (EGSE) for satellite testing. The modular approach contains several PXI mainframes with off-the-shelf modules to cover common EGSE functions, complemented by specialized NI PXI FPGA modules and 19 in. instrumentation. The system is controlled either via remote with the OPC UA module, or locally, via the customized GUI.
Best Practices for Designing Rugged SDR Solutions for Field Applications
Steve Romm, AVDOR
The exponential technological advances we are witnessing are also responsible for an increased variety and number of threats. That’s why police, first responders, and armies need EW, jammers, antidrones, and other systems that are field capable and flexible enough to be deployed on the battlefield or around critical infrastructures. Off-the-shelf platforms can provide flexibility, but are not rugged enough for demanding environments. Learn best practices for environmental, mechanical, thermal, and signal design to fortify OTS platforms, such NI SDR, and build reliable, powerful systems that increase defence and security force capabilities.
Thursday, 21 November 2019
|10:45||Coffee Break - Exhibition|
Testing at Airbus Military Aircraft Systems
Santiago Lopez, AIRBUS DEFENCE AND SPACE
Testing is essential in the development and production stage of every aircraft. Airbus D&S Military Aircrafts has reached a very high level of integration to tightly replicate real-flight operation by interconnecting and synchronizing several aircraft systems rigs. The NI test platform provides us with test results that meet our schedule, cost, and quality requirements, all in a unique test facility.
Gripen E Hardware-in-the-Loop Simulators Using NI Products
Eric Karlsson, SAAB AERONAUTICS
Hardware-in-the-loop (HIL) simulators are very important for developing and verifying the new Gripen E aircraft. When testing the system in an HIL simulator, the zeros and ones in the computer simulation must be converted to real electrical signals suitable for the device under test. National Instruments controllers and signal conditioning products make these conversions possible.
Mark Gallagher, Grand Prix Motor Racing executive
Abstract will follow soon
A Flexible Platform for Validation Testing on Electrical Aircrafts
Javier Gutierrez, NATIONAL INSTRUMENTS
Electrical-based subsystems offer clear advantages over their predecessors, driven by technology advancements in power electronics—but simulating and testing these electric and electromechanical systems presents significant challenges. To fully take advantage of the benefits of electrical systems, you need a test platform and methodology that can address these challenges. Learn more about a platform capable of integrating the latest models and algorithms and an ecosystem of vendors servicing this market, that can perform highly deterministic, real-time simulation routines across hundreds or even thousands of cases and capable of integrating I/O, buses, and even RF comms.
Cutting Edge Test Tools for Cutting Edge Space Processors
Francisco Javier Moreno Carrillo and Luis Angel Gómez Fernández, THALES ALENIA SPACE
The new generation of Telecommunication On Board Processors developed by Thales Alenia Space España are capable of handling complex RF signals adapting to dynamic traffic scenarios in a very agile way. Testing this type of devices means a challenge as we need to generate complex signals with high dynamicity and embedding simulated traffic complex enough to validate the entire Hardware – Firmware – Software data processing chain. The advanced features of the NI RF signal generation devices and tools as well as the solid technical support of NI technical team has been key for the fast and reliable testing of these On Board Processors meeting the high quality standards of the Space business
Coffee Break - Exhibition
NI cDAQ application for civil UAV ground and flight test.
Dmitry Soloviov, VR-TECHNOLOGY
Learn about the NI CompactDAQ data acquisition system and how it's being used in VRT300 civil unmanned aerial vehicle (UAV) preproduction configuration ground and flight testing. Hear how NI software and hardware solutions implemented upgrades and modifications into the system over the course of testing and incorporated or eliminated certain functions to address specific tasks.
Strategies for Obsolescence Management Planning
Raghunandan N V,NATIONAL INSTRUMENTS
The surest way to suffer an expensive and risky obsolescence event is to fail to plan for vendor, component, and software end-of-life in your test systems. In this session, we discuss the risks and benefits of different obsolescence-management strategies and best practices for reducing risk in long-life test programs.